Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "toc:db/journals/et/et24.bht:"
download as .bib file
@article{DBLP:journals/et/Agrawal08,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {1},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5069-z},
doi = {10.1007/S10836-008-5069-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal08a,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {321},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5076-0},
doi = {10.1007/S10836-008-5076-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal08a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal08b,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {421},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5089-8},
doi = {10.1007/S10836-008-5089-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal08b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal08c,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {505--506},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5093-z},
doi = {10.1007/S10836-008-5093-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal08c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BadereddineWGCVPL08,
author = {Nabil Badereddine and
Zhanglei Wang and
Patrick Girard and
Krishnendu Chakrabarty and
Arnaud Virazel and
Serge Pravossoudovitch and
Christian Landrault},
title = {A Selective Scan Slice Encoding Technique for Test Data Volume and
Test Power Reduction},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {353--364},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5053-z},
doi = {10.1007/S10836-007-5053-Z},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/BadereddineWGCVPL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BhuniaMRR08,
author = {Swarup Bhunia and
Hamid Mahmoodi and
Arijit Raychowdhury and
Kaushik Roy},
title = {Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating
Technique},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {577--590},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5072-4},
doi = {10.1007/S10836-008-5072-4},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BhuniaMRR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BolchiniMRSSSV08,
author = {Cristiana Bolchini and
Antonio Miele and
Fabio Rebaudengo and
Fabio Salice and
Donatella Sciuto and
Luca Sterpone and
Massimo Violante},
title = {Software and Hardware Techniques for {SEU} Detection in {IP} Processors},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {35--44},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5028-0},
doi = {10.1007/S10836-007-5028-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BolchiniMRSSSV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChangLH08,
author = {Da{-}Ming Chang and
Jin{-}Fu Li and
Yu{-}Jen Huang},
title = {A Built-In Redundancy-Analysis Scheme for Random Access Memories with
Two-Level Redundancy},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {181--192},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5032-4},
doi = {10.1007/S10836-007-5032-4},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChangLH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChoiC08,
author = {Myungsu Choi and
Minsu Choi},
title = {Scalability of Globally Asynchronous {QCA} (Quantum-Dot Cellular Automata)
Adder Design},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {313--320},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5052-0},
doi = {10.1007/S10836-007-5052-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChoiC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChristouMT08,
author = {Kyriakos Christou and
Maria K. Michael and
Spyros Tragoudas},
title = {On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault
Test Generation},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {203--222},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5020-8},
doi = {10.1007/S10836-007-5020-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChristouMT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DattaADCN08,
author = {Ramyanshu Datta and
Jacob A. Abraham and
Abdulkadir Utku Diril and
Abhijit Chatterjee and
Kevin J. Nowka},
title = {Performance-Optimized Design for Parametric Reliability},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {129--141},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5001-y},
doi = {10.1007/S10836-007-5001-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DattaADCN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DattaGSAd08,
author = {Ramyanshu Datta and
Ravi Gupta and
Antony Sebastine and
Jacob A. Abraham and
Manuel A. d'Abreu},
title = {Controllability of Static {CMOS} Circuits for Timing Characterization},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {481--496},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5059-6},
doi = {10.1007/S10836-007-5059-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DattaGSAd08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DumasXGBR08,
author = {Norbert Dumas and
Zhou Xu and
Kostas Georgopoulos and
R. John T. Bunyan and
Andrew Richardson},
title = {Online Testing of {MEMS} Based on Encoded Stimulus Superposition},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {555--566},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5090-2},
doi = {10.1007/S10836-008-5090-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DumasXGBR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FangH08,
author = {Lei Fang and
Michael S. Hsiao},
title = {Bilateral Testing of Nano-scale Fault-Tolerant Circuits},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {285--296},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5041-3},
doi = {10.1007/S10836-007-5041-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FangH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FazeliFM08,
author = {Mahdi Fazeli and
Reza Farivar and
Seyed Ghassem Miremadi},
title = {Error Detection Enhancement in PowerPC Architecture-based Embedded
Processors},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {21--33},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5017-3},
doi = {10.1007/S10836-007-5017-3},
timestamp = {Wed, 16 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/FazeliFM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GangulyPBG08,
author = {Amlan Ganguly and
Partha Pratim Pande and
Benjamin Belzer and
Cristian Grecu},
title = {Design of Low Power {\&} Reliable Networks on Chip Through Joint
Crosstalk Avoidance and Multiple Error Correction Coding},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {67--81},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5035-1},
doi = {10.1007/S10836-007-5035-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GangulyPBG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GomezGC08,
author = {Roberto G{\'{o}}mez and
Alejandro Gir{\'{o}}n and
V{\'{\i}}ctor H. Champac},
title = {A Test Generation Methodology for Interconnection Opens Considering
Signals at the Coupled Lines},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {529--538},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5085-z},
doi = {10.1007/S10836-008-5085-Z},
timestamp = {Fri, 22 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/GomezGC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GongCLDW08,
author = {Rui Gong and
Wei Chen and
Fang Liu and
Kui Dai and
Zhiying Wang},
title = {A New Approach to Single Event Effect Tolerance Based on Asynchronous
Circuit Technique},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {57--65},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5029-z},
doi = {10.1007/S10836-007-5029-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GongCLDW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GoyalC08,
author = {Shalabh Goyal and
Abhijit Chatterjee},
title = {Linearity Testing of {A/D} Converters Using Selective Code Measurement},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {567--576},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5071-5},
doi = {10.1007/S10836-008-5071-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GoyalC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GranhaugA08,
author = {Kristian Granhaug and
Snorre Aunet},
title = {Improving Yield and Defect Tolerance in Subthreshold {CMOS} Through
Output-Wired Redundancy},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {157--163},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5027-1},
doi = {10.1007/S10836-007-5027-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GranhaugA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GrazianoR08,
author = {Mariagrazia Graziano and
Massimo Ruo Roch},
title = {An Automotive CD-Player Electro-Mechanics Fault Simulation Using {VHDL-AMS}},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {539--553},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5064-4},
doi = {10.1007/S10836-008-5064-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GrazianoR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HePERA08,
author = {Zhiyuan He and
Zebo Peng and
Petru Eles and
Paul M. Rosinger and
Bashir M. Al{-}Hashimi},
title = {Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {247--257},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5030-6},
doi = {10.1007/S10836-007-5030-6},
timestamp = {Tue, 09 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HePERA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HuangT08,
author = {Guangyu Huang and
Cher Ming Tan},
title = {Reverse Breakdown Voltage Measurement for Power P\({}^{\mbox{+}}\)NN\({}^{\mbox{+}}\)
Rectifier},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {473--479},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5054-y},
doi = {10.1007/S10836-007-5054-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HuangT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JangKL08,
author = {Byunghyun Jang and
Yong{-}Bin Kim and
Fabrizio Lombardi},
title = {Monomer Control for Error Tolerance in {DNA} Self-Assembly},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {271--284},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5016-4},
doi = {10.1007/S10836-007-5016-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JangKL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JasCC08,
author = {Abhijit Jas and
Yi{-}Shing Chang and
Sreejit Chakravarty},
title = {A Methodology for Handling Complex Functional Constraints for Large
Industrial Designs},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {259--269},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5024-4},
doi = {10.1007/S10836-007-5024-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JasCC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KimKH08,
author = {Hong{-}Sik Kim and
Sungho Kang and
Michael S. Hsiao},
title = {A New Scan Architecture for Both Low Power Testing and Test Volume
Compression Under {SOC} Test Environment},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {365--378},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5062-6},
doi = {10.1007/S10836-008-5062-6},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/KimKH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KoN08,
author = {Ho Fai Ko and
Nicola Nicolici},
title = {Scan Division Algorithm for Shift and Capture Power Reduction for
At-Speed Test Using Skewed-Load Test Application Strategy},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {393--403},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5036-0},
doi = {10.1007/S10836-007-5036-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KoN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LarssonP08,
author = {Erik Larsson and
Zebo Peng},
title = {A Reconfigurable Power Conscious Core Wrapper and its Application
to System-on-Chip Test Scheduling},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {497--504},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5074-2},
doi = {10.1007/S10836-008-5074-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LarssonP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LinH08,
author = {Xijiang Lin and
Yu Huang},
title = {Scan Shift Power Reduction by Freezing Power Sensitive Scan Cells},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {327--334},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5048-9},
doi = {10.1007/S10836-007-5048-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LinH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiuNUS08,
author = {Lushan Liu and
Pradeep Nagaraj and
Shambhu J. Upadhyaya and
Ramalingam Sridhar},
title = {Defect Analysis and Defect Tolerant Design of Multi-port SRAMs},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {165--179},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5023-5},
doi = {10.1007/S10836-007-5023-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LiuNUS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaHML08,
author = {Xiaojun Ma and
Jing Huang and
Cecilia Metra and
Fabrizio Lombardi},
title = {Reversible Gates and Testability of One Dimensional Arrays of Molecular
{QCA}},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {297--311},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5042-2},
doi = {10.1007/S10836-007-5042-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaHML08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaL08,
author = {Xiaojun Ma and
Fabrizio Lombardi},
title = {Substrate Testing on a Multi-Site/Multi-Probe {ATE}},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {193--201},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5038-y},
doi = {10.1007/S10836-007-5038-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MiuraK08,
author = {Yukiya Miura and
Jiro Kato},
title = {Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model
and \emph{X} - \emph{Y} Zoning Method},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {223--233},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5022-6},
doi = {10.1007/S10836-007-5022-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MiuraK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NetoWK08,
author = {Egas Henes Neto and
Gilson I. Wirth and
Fernanda Lima Kastensmidt},
title = {Mitigating Soft Errors in {SRAM} Address Decoders Using Built-in Current
Sensors},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {425--437},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5056-9},
doi = {10.1007/S10836-007-5056-9},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NetoWK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NicoliciG08,
author = {Nicola Nicolici and
Patrick Girard},
title = {Guest Editorial},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {325--326},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5063-5},
doi = {10.1007/S10836-008-5063-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NicoliciG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PetroliLKC08,
author = {Lorenzo Petroli and
Carlos Arthur Lang Lisb{\^{o}}a and
Fernanda Lima Kastensmidt and
Luigi Carro},
title = {Majority Logic Mapping for Soft Error Dependability},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {83--92},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5044-0},
doi = {10.1007/S10836-007-5044-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PetroliLKC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PontarelliOVCLS08,
author = {Salvatore Pontarelli and
Marco Ottavi and
Vamsi Vankamamidi and
Gian Carlo Cardarilli and
Fabrizio Lombardi and
Adelio Salsano},
title = {Analysis and Evaluations of Reliability of Reconfigurable FPGAs},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {105--116},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5040-4},
doi = {10.1007/S10836-007-5040-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PontarelliOVCLS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RastogiGSK08,
author = {Ashesh Rastogi and
Kunal P. Ganeshpure and
Alodeep Sanyal and
Sandip Kundu},
title = {On Composite Leakage Current Maximization},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {405--420},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5049-8},
doi = {10.1007/S10836-007-5049-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RastogiGSK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RhodLCRV08,
author = {Eduardo Luis Rhod and
Carlos Arthur Lang Lisb{\^{o}}a and
Luigi Carro and
Matteo Sonza Reorda and
Massimo Violante},
title = {Hardware and Software Transparency in the Protection of Programs Against
SEUs and SETs},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {45--56},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5018-2},
doi = {10.1007/S10836-007-5018-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RhodLCRV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RossiOM08,
author = {Daniele Rossi and
Martin Oma{\~{n}}a and
Cecilia Metra},
title = {Checkers' No-Harm Alarms and Design Approaches to Tolerate Them},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {93--103},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5031-5},
doi = {10.1007/S10836-007-5031-5},
timestamp = {Sun, 20 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/RossiOM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SasakiNI08,
author = {Yoichi Sasaki and
Kazuteru Namba and
Hideo Ito},
title = {Circuit and Latch Capable of Masking Soft Errors with Schmitt Trigger},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {11--19},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5034-2},
doi = {10.1007/S10836-007-5034-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SasakiNI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Sinanoglu08,
author = {Ozgur Sinanoglu},
title = {Scan-in and Scan-out Transition Co-optimization Through Modelling
Generalized Serial Transformations},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {335--351},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5021-7},
doi = {10.1007/S10836-007-5021-7},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/Sinanoglu08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Sinanoglu08a,
author = {Ozgur Sinanoglu},
title = {Improving the Effectiveness of Combinational Decompressors Through
Judicious Partitioning of Scan Cells},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {439--448},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5039-x},
doi = {10.1007/S10836-007-5039-X},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/Sinanoglu08a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SunterR08,
author = {Stephen K. Sunter and
Aubin Roy},
title = {Noise-Insensitive Digital {BIST} for any {PLL} or {DLL}},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {461--472},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5061-z},
doi = {10.1007/S10836-007-5061-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SunterR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Tarnick08,
author = {Steffen Tarnick},
title = {Self-Testing Embedded Borden \emph{t} -UED Code Checkers for \emph{t}
= 2\({}^{\mbox{ \emph{k} }}\) \emph{q} - 1 with \emph{q} = 2\({}^{\mbox{
\emph{m} }}\) - 1},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {509--527},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5073-3},
doi = {10.1007/S10836-008-5073-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Tarnick08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ToubaSC08,
author = {Nur A. Touba and
Adelio Salsano and
Minsu Choi},
title = {Guest Editorial},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {9--10},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5067-1},
doi = {10.1007/S10836-008-5067-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ToubaSC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/UpadhyayaVSGKBM08,
author = {Shambhu J. Upadhyaya and
Nandakumar P. Venugopal and
Nihal Shastry and
Srinivasan Gopalakrishnan and
Bharath V. Kuppuswamy and
Rana Bhowmick and
Prerna Mayor},
title = {Design Considerations for High Performance {RF} Cores Based on Process
Variation Study},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {143--155},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5019-1},
doi = {10.1007/S10836-007-5019-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/UpadhyayaVSGKBM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WenMSKWSK08,
author = {Xiaoqing Wen and
Kohei Miyase and
Tatsuya Suzuki and
Seiji Kajihara and
Laung{-}Terng Wang and
Kewal K. Saluja and
Kozo Kinoshita},
title = {Low Capture Switching Activity Test Generation for Reducing IR-Drop
in At-Speed Scan Testing},
journal = {J. Electron. Test.},
volume = {24},
number = {4},
pages = {379--391},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5033-3},
doi = {10.1007/S10836-007-5033-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WenMSKWSK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WichlundBA08,
author = {Sverre Wichlund and
Frank Berntsen and
Einar J. Aas},
title = {Scan Test Response Compaction Combined with Diagnosis Capabilities},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {235--246},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5043-1},
doi = {10.1007/S10836-007-5043-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WichlundBA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YangKCK08,
author = {Myung{-}Hoon Yang and
YongJoon Kim and
Sunghoon Chun and
Sungho Kang},
title = {An Effective Power Reduction Methodology for Deterministic {BIST}
Using Auxiliary {LFSR}},
journal = {J. Electron. Test.},
volume = {24},
number = {6},
pages = {591--595},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5077-z},
doi = {10.1007/S10836-008-5077-Z},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/YangKCK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YooF08,
author = {Joonhyuk Yoo and
Manoj Franklin},
title = {Hierarchical Verification for Increasing Performance in Reliable Processors},
journal = {J. Electron. Test.},
volume = {24},
number = {1-3},
pages = {117--128},
year = {2008},
url = {https://doi.org/10.1007/s10836-007-5037-z},
doi = {10.1007/S10836-007-5037-Z},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/YooF08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangAC08,
author = {Xinsong Zhang and
Simon S. Ang and
Chandra Carter},
title = {Comparison of {NIST} and Wavelet Transform Test Point Selection Methods
For a Programmable Gain Amplifier},
journal = {J. Electron. Test.},
volume = {24},
number = {5},
pages = {449--460},
year = {2008},
url = {https://doi.org/10.1007/s10836-008-5070-6},
doi = {10.1007/S10836-008-5070-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangAC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-05-30 02:47 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
