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@inproceedings{DBLP:conf/ets/AbdennadherS16,
  author       = {Salem Abdennadher and
                  Saghir A. Shaikh},
  title        = {Practices in High-Speed {IO} testing},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519317},
  doi          = {10.1109/ETS.2016.7519317},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/AbdennadherS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/AgboTHWCCD16,
  author       = {Innocent Agbo and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Pieter Weckx and
                  Stefan Cosemans and
                  Francky Catthoor and
                  Wim Dehaene},
  title        = {Read path degradation analysis in {SRAM}},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519325},
  doi          = {10.1109/ETS.2016.7519325},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/AgboTHWCCD16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/AryanFBYSG16,
  author       = {Nasim Pour Aryan and
                  Christian Funke and
                  Jens Bargfrede and
                  Cenk Yilmaz and
                  Doris Schmitt{-}Landsiedel and
                  Georg Georgakos},
  title        = {In situ measurement of aging-induced performance degradation in digital
                  circuits},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519285},
  doi          = {10.1109/ETS.2016.7519285},
  timestamp    = {Thu, 24 Jan 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/AryanFBYSG16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/CantoroMRZL16,
  author       = {Riccardo Cantoro and
                  Mehrdad Montazeri and
                  Matteo Sonza Reorda and
                  Farrokh Ghani Zadegan and
                  Erik Larsson},
  title        = {On the diagnostic analysis of {IEEE} 1687 networks},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519294},
  doi          = {10.1109/ETS.2016.7519294},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/CantoroMRZL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/CharifZN16,
  author       = {Amir Charif and
                  Nacer{-}Eddine Zergainoh and
                  Michael Nicolaidis},
  title        = {Addressing transient routing errors in fault-tolerant Networks-on-Chips},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519289},
  doi          = {10.1109/ETS.2016.7519289},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/CharifZN16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ChenK16,
  author       = {Te{-}Hui Chen and
                  David C. Keezer},
  title        = {A 40Gbps economic extension board and FPGA-based testing platform},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519297},
  doi          = {10.1109/ETS.2016.7519297},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/ChenK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ChenZLLO16,
  author       = {Weida Chen and
                  Yongxin Zhu and
                  Xinyi Liu and
                  Xinyang Li and
                  Dongyu Ou},
  title        = {Combining the histogram method and the ultrafast segmented model identification
                  of linearity errors algorithm for {ADC} linearity testing},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519298},
  doi          = {10.1109/ETS.2016.7519298},
  timestamp    = {Thu, 15 Mar 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/ChenZLLO16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/CosterHPSCMACB16,
  author       = {Jeroen De Coster and
                  Peter De Heyn and
                  Marianna Pantouvaki and
                  Brad Snyder and
                  Hongtao Chen and
                  Erik Jan Marinissen and
                  Philippe Absil and
                  Joris Van Campenhout and
                  Bryan Bolt},
  title        = {Test-station for flexible semi-automatic wafer-level silicon photonics
                  testing},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519306},
  doi          = {10.1109/ETS.2016.7519306},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/CosterHPSCMACB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/DuSC16,
  author       = {Boyang Du and
                  Luca Sterpone and
                  David Merodio Codinachs},
  title        = {A new {EDA} flow for the mitigation of SEUs in dynamic reconfigurable
                  FPGAs},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519323},
  doi          = {10.1109/ETS.2016.7519323},
  timestamp    = {Wed, 25 Sep 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/DuSC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/DuruptVS16,
  author       = {Jean Durupt and
                  Pascal Vivet and
                  Juergen Schloeffel},
  title        = {{IJTAG} supported 3D {DFT} using chiplet-footprints for testing multi-chips
                  active interposer system},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519310},
  doi          = {10.1109/ETS.2016.7519310},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/DuruptVS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/EggersglussMW16,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  Kohei Miyase and
                  Xiaoqing Wen},
  title        = {SAT-based post-processing for regional capture power reduction in
                  at-speed scan test generation},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519327},
  doi          = {10.1109/ETS.2016.7519327},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/EggersglussMW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/FujibeSMMWMM16,
  author       = {Tasuku Fujibe and
                  Kazuki Shirahata and
                  Takeshi Mizushima and
                  Hidenobu Matsumura and
                  Daisuke Watanabe and
                  Hiroyuki Mineo and
                  Shin Masuda},
  title        = {An optical/electrical test system for 100Gb/s optical interconnection
                  devices with high volume testing capability},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519282},
  doi          = {10.1109/ETS.2016.7519282},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/FujibeSMMWMM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GaiV16,
  author       = {Paolo Gai and
                  Massimo Violante},
  title        = {Automotive embedded software architecture in the multi-core age},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519309},
  doi          = {10.1109/ETS.2016.7519309},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/GaiV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GeorgiouVKC16,
  author       = {Panagiotis Georgiou and
                  Fotios Vartziotis and
                  Xrysovalantis Kavousianos and
                  Krishnendu Chakrabarty},
  title        = {Two-dimensional time-division multiplexing for 3D-SoCs},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519312},
  doi          = {10.1109/ETS.2016.7519312},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/GeorgiouVKC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GinesPLRRBM16,
  author       = {Antonio J. Gin{\'{e}}s and
                  Eduardo J. Peral{\'{\i}}as and
                  Gildas L{\'{e}}ger and
                  Adoraci{\'{o}}n Rueda and
                  Guillaume Renaud and
                  Manuel J. Barrag{\'{a}}n and
                  Salvador Mir},
  title        = {Linearity test of high-speed high-performance ADCs using a self-testable
                  on-chip generator},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519308},
  doi          = {10.1109/ETS.2016.7519308},
  timestamp    = {Wed, 28 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/GinesPLRRBM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GrandhiDSSP16,
  author       = {Satish Grandhi and
                  Elsa Dupraz and
                  Christian Spagnol and
                  Valentin Savin and
                  Emanuel M. Popovici},
  title        = {{CPE:} Codeword Prediction Encoder},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519283},
  doi          = {10.1109/ETS.2016.7519283},
  timestamp    = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/GrandhiDSSP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Hadjitheophanous16,
  author       = {Stavros Hadjitheophanous and
                  Stelios N. Neophytou and
                  Maria K. Michael},
  title        = {Utilizing shared memory multi-cores to speed-up the {ATPG} process},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519328},
  doi          = {10.1109/ETS.2016.7519328},
  timestamp    = {Sat, 16 Sep 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Hadjitheophanous16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HamdiouiNKMS16,
  author       = {Said Hamdioui and
                  Giorgio Di Natale and
                  Bram Kruseman and
                  Maria K. Michael and
                  Haralampos{-}G. D. Stratigopoulos},
  title        = {{ETS} 2016 foreword},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519275},
  doi          = {10.1109/ETS.2016.7519275},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/HamdiouiNKMS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HuhnED16,
  author       = {Sebastian Huhn and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  Rolf Drechsler},
  title        = {VecTHOR: Low-cost compression architecture for {IEEE} 1149-compliant
                  {TAP} controllers},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519303},
  doi          = {10.1109/ETS.2016.7519303},
  timestamp    = {Sun, 02 Jun 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/HuhnED16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/IbrahimK16,
  author       = {Ahmed Ibrahim and
                  Hans G. Kerkhoff},
  title        = {Analysis and design of an on-chip retargeting engine for {IEEE} 1687
                  networks},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519301},
  doi          = {10.1109/ETS.2016.7519301},
  timestamp    = {Wed, 08 Jan 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/IbrahimK16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/JutmanAD16,
  author       = {Artur Jutman and
                  Igor Aleksejev and
                  Sergei Devadze},
  title        = {On coverage of timing related faults at board level},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519295},
  doi          = {10.1109/ETS.2016.7519295},
  timestamp    = {Sun, 25 Oct 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/JutmanAD16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KinseherVZP16,
  author       = {Josef Kinseher and
                  Moritz V{\"{o}}lker and
                  Leonardo Bonet Zordan and
                  Ilia Polian},
  title        = {Failure mechanisms and test methods for the {SRAM} {TVC} write-assist
                  technique},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519324},
  doi          = {10.1109/ETS.2016.7519324},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/KinseherVZP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KochteBSBW16,
  author       = {Michael A. Kochte and
                  Rafal Baranowski and
                  Matthias Sauer and
                  Bernd Becker and
                  Hans{-}Joachim Wunderlich},
  title        = {Formal verification of secure reconfigurable scan network infrastructure},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519290},
  doi          = {10.1109/ETS.2016.7519290},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/KochteBSBW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KoneruC16,
  author       = {Abhishek Koneru and
                  Krishnendu Chakrabarty},
  title        = {Analysis of electrostatic coupling in monolithic 3D integrated circuits
                  and its impact on delay testing},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519292},
  doi          = {10.1109/ETS.2016.7519292},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/KoneruC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/LegerB16,
  author       = {Gildas L{\'{e}}ger and
                  Manuel J. Barrag{\'{a}}n},
  title        = {Questioning the reliability of Monte Carlo simulation for machine
                  learning test validation},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519307},
  doi          = {10.1109/ETS.2016.7519307},
  timestamp    = {Wed, 28 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/LegerB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/LinRR16,
  author       = {Xijiang Lin and
                  Sudhakar M. Reddy and
                  Janusz Rajski},
  title        = {Transistor stuck-on fault detection tests for digital {CMOS} circuits},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519329},
  doi          = {10.1109/ETS.2016.7519329},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/LinRR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/MarinissenMJ16,
  author       = {Erik Jan Marinissen and
                  Teresa L. McLaurin and
                  Hailong Jiao},
  title        = {{IEEE} Std {P1838:} DfT standard-under-development for 2.5D-, 3D-,
                  and 5.5D-SICs},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519330},
  doi          = {10.1109/ETS.2016.7519330},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/MarinissenMJ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/MarinissenZKHHC16,
  author       = {Erik Jan Marinissen and
                  Yervant Zorian and
                  Mario Konijnenburg and
                  Chih{-}Tsun Huang and
                  Ping{-}Hsuan Hsieh and
                  Peter Cockburn and
                  Jeroen Delvaux and
                  Vladimir Rozic and
                  Bohan Yang and
                  Dave Singel{\'{e}}e and
                  Ingrid Verbauwhede and
                  Cedric Mayor and
                  Robert Van Rijsinge and
                  Cocoy Reyes},
  title        = {IoT: Source of test challenges},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519331},
  doi          = {10.1109/ETS.2016.7519331},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/MarinissenZKHHC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/MaxwellHT16,
  author       = {Peter C. Maxwell and
                  Friedrich Hapke and
                  Huaxing Tang},
  title        = {Cell-aware diagnosis: Defective inmates exposed in their cells},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519313},
  doi          = {10.1109/ETS.2016.7519313},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MaxwellHT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/MayugaYYSI16,
  author       = {Gian Mayuga and
                  Yuta Yamato and
                  Tomokazu Yoneda and
                  Yasuo Sato and
                  Michiko Inoue},
  title        = {Reliability enhancement of embedded memory with combination of aging-aware
                  adaptive in-field self-repair and {ECC}},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519284},
  doi          = {10.1109/ETS.2016.7519284},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MayugaYYSI16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/MesallesVRC16,
  author       = {Francisco Mesalles and
                  Hector Villacorta and
                  Michel Renovell and
                  V{\'{\i}}ctor H. Champac},
  title        = {Behavior and test of open-gate defects in FinFET based cells},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519305},
  doi          = {10.1109/ETS.2016.7519305},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MesallesVRC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Mitra16,
  author       = {Subhasish Mitra},
  title        = {Cross-layer resilience},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519318},
  doi          = {10.1109/ETS.2016.7519318},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Mitra16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/NawiHZ16,
  author       = {Illani Mohd Nawi and
                  Basel Halak and
                  Mark Zwolinski},
  title        = {The influence of hysteresis voltage on single event transients in
                  a 65nm {CMOS} high speed comparator},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519300},
  doi          = {10.1109/ETS.2016.7519300},
  timestamp    = {Sun, 02 Jun 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/NawiHZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Nigh16,
  author       = {Phil Nigh},
  title        = {Testing in the year 2024 - big changes are coming},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519319},
  doi          = {10.1109/ETS.2016.7519319},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Nigh16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/NirmalaVGI16,
  author       = {Ithihasa Reddy Nirmala and
                  Deepak Vontela and
                  Swaroop Ghosh and
                  Anirudh Iyengar},
  title        = {A novel threshold voltage defined switch for circuit camouflaging},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519286},
  doi          = {10.1109/ETS.2016.7519286},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/NirmalaVGI16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/NishimakiHF16,
  author       = {Jun Nishimaki and
                  Toshinori Hosokawa and
                  Hideo Fujiwara},
  title        = {A scheduling method for hierarchical testability based on test environment
                  generation results},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519299},
  doi          = {10.1109/ETS.2016.7519299},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/NishimakiHF16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Portolan16,
  author       = {Michele Portolan},
  title        = {A novel test generation and application flow for functional access
                  to {IEEE} 1687 instruments},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519302},
  doi          = {10.1109/ETS.2016.7519302},
  timestamp    = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Portolan16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/PotluriTSV16,
  author       = {Seetal Potluri and
                  Satya Trinadh and
                  Siddhant Saraf and
                  Kamakoti Veezhinathan},
  title        = {Component fault localization using switching current measurements},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519322},
  doi          = {10.1109/ETS.2016.7519322},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/PotluriTSV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Reger16,
  author       = {Lars Reger},
  title        = {Securely connected vehicles - what it takes to make self-driving cars
                  a reality},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519280},
  doi          = {10.1109/ETS.2016.7519280},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Reger16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Sarson16,
  author       = {Peter Sarson},
  title        = {Group delay filter measurement using a chirp},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519321},
  doi          = {10.1109/ETS.2016.7519321},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Sarson16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Singh16,
  author       = {Adit D. Singh},
  title        = {Cell Aware and stuck-open tests},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519316},
  doi          = {10.1109/ETS.2016.7519316},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Singh16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/SunterVM16,
  author       = {Stephen Sunter and
                  Alessandro Valerio and
                  Riccardo Miglierina},
  title        = {Measuring defect tolerance within mixed-signal ICs},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519320},
  doi          = {10.1109/ETS.2016.7519320},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/SunterVM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/TholeAF16,
  author       = {Niels Thole and
                  Lorena Anghel and
                  G{\"{o}}rschwin Fey},
  title        = {A hybrid algorithm to conservatively check the robustness of circuits},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519326},
  doi          = {10.1109/ETS.2016.7519326},
  timestamp    = {Fri, 02 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/TholeAF16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ValiN16,
  author       = {Amin Vali and
                  Nicola Nicolici},
  title        = {Bit-flip detection-driven selection of trace signals},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519315},
  doi          = {10.1109/ETS.2016.7519315},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/ValiN16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/VeeravalliS16,
  author       = {Varadan Savulimedu Veeravalli and
                  Andreas Steininger},
  title        = {Study of a delayed single-event effect in the Muller C-element},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519287},
  doi          = {10.1109/ETS.2016.7519287},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/VeeravalliS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/WaliDVBGR16,
  author       = {Imran Wali and
                  Bastien Deveautour and
                  Arnaud Virazel and
                  Alberto Bosio and
                  Patrick Girard and
                  Matteo Sonza Reorda},
  title        = {A low-cost susceptibility analysis methodology to selectively harden
                  logic circuits},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519296},
  doi          = {10.1109/ETS.2016.7519296},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/WaliDVBGR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/WangC16,
  author       = {Ran Wang and
                  Krishnendu Chakrabarty},
  title        = {A design-for-test solution for monolithic 3D integrated circuits},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519311},
  doi          = {10.1109/ETS.2016.7519311},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/WangC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/WeiLW16,
  author       = {Sin{-}Yu Wei and
                  Bing{-}Yang Lin and
                  Cheng{-}Wen Wu},
  title        = {A fast sweep-line-based failure pattern extractor for memory diagnosis},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519314},
  doi          = {10.1109/ETS.2016.7519314},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/WeiLW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Wu16,
  author       = {Cheng{-}Wen Wu},
  title        = {Is IoT coming to the rescue of semiconductor?},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519304},
  doi          = {10.1109/ETS.2016.7519304},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Wu16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/WuCL16,
  author       = {Han{-}Yu Wu and
                  Yong{-}Xiao Chen and
                  Jin{-}Fu Li},
  title        = {A built-in method for measuring the delay of TSVs in 3D ICs},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519293},
  doi          = {10.1109/ETS.2016.7519293},
  timestamp    = {Tue, 17 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/WuCL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/WunderlichM16,
  author       = {Hans{-}Joachim Wunderlich and
                  Peter C. Maxwell},
  title        = {{ETS} 2015 best paper},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519278},
  doi          = {10.1109/ETS.2016.7519278},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/WunderlichM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/YangHTC16,
  author       = {Shaofu Yang and
                  Shi{-}Yu Huang and
                  Kun{-}Han Tsai and
                  Wu{-}Tung Cheng},
  title        = {Testing of small delay faults in a clock network},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519291},
  doi          = {10.1109/ETS.2016.7519291},
  timestamp    = {Mon, 22 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/YangHTC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ZadeganNL16,
  author       = {Farrokh Ghani Zadegan and
                  Dimitar Nikolov and
                  Erik Larsson},
  title        = {A self-reconfiguring {IEEE} 1687 network for fault monitoring},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519288},
  doi          = {10.1109/ETS.2016.7519288},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/ZadeganNL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ZhangFLL16,
  author       = {Jing Zhang and
                  Lars{-}Johan Fritz and
                  Liang Liu and
                  Erik Larsson},
  title        = {Compressor design for silicon debug},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519281},
  doi          = {10.1109/ETS.2016.7519281},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/ZhangFLL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/ets/2016,
  title        = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/7510593/proceeding},
  isbn         = {978-1-4673-9659-2},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/2016.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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