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@inproceedings{DBLP:conf/dft/AhmedT05,
author = {Nisar Ahmed and
Mohammad Tehranipoor},
title = {Improving Transition Delay Fault Coverage Using Hybrid Scan-Based
Technique},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {187--198},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.69},
doi = {10.1109/DFTVS.2005.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/AhmedT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Al-YamaniDG05,
author = {Ahmad A. Al{-}Yamani and
Narendra Devta{-}Prasanna and
Arun Gunda},
title = {Should Illinois-Scan Based Architectures be Centralized or Distributed?},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {406--414},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.59},
doi = {10.1109/DFTVS.2005.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Al-YamaniDG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/AliBM05,
author = {Sadeka Ali and
Gregory Briggs and
Martin Margala},
title = {A High Frequency, Low Jitter Auto-Calibration Phase-Locked Loop with
Built-in-Self-Test},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {591--600},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.8},
doi = {10.1109/DFTVS.2005.8},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/AliBM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/AsadiT05,
author = {Hossein Asadi and
Mehdi Baradaran Tahoori},
title = {Soft Error Modeling and Protection for Sequential Elements},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {463--474},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.61},
doi = {10.1109/DFTVS.2005.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/AsadiT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Bayat-SarmadiH05,
author = {Siavash Bayat Sarmadi and
M. Anwar Hasan},
title = {Concurrent Error Detection of Polynomial Basis Multiplication over
Extension Fields using a Multiple-bit Parity Scheme},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {102--110},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.24},
doi = {10.1109/DFTVS.2005.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Bayat-SarmadiH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BernardiBRRV05,
author = {Paolo Bernardi and
Let{\'{\i}}cia Maria Veiras Bolzani and
Maurizio Rebaudengo and
Matteo Sonza Reorda and
Massimo Violante},
title = {An Integrated Approach for Increasing the Soft-Error Detection Capabilities
in SoCs processors},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {445--453},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.17},
doi = {10.1109/DFTVS.2005.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BernardiBRRV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BolchiniMSS05,
author = {Cristiana Bolchini and
Antonio Miele and
Fabio Salice and
Donatella Sciuto},
title = {A model of soft error effects in generic {IP} processors},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {334--342},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.10},
doi = {10.1109/DFTVS.2005.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BolchiniMSS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BreveglieriKM05,
author = {Luca Breveglieri and
Israel Koren and
Paolo Maistri},
title = {Incorporating Error Detection and Online Reconfiguration into a Regular
Architecture for the Advanced Encryption Standard},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {72--80},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.41},
doi = {10.1109/DFTVS.2005.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BreveglieriKM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CardarilliPRS05,
author = {Gian Carlo Cardarilli and
Salvatore Pontarelli and
Marco Re and
Adelio Salsano},
title = {A Self Checking Reed Solomon Encoder: Design and Analysis},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {111--119},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.13},
doi = {10.1109/DFTVS.2005.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/CardarilliPRS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CardarilliPRS05a,
author = {Gian Carlo Cardarilli and
Salvatore Pontarelli and
Marco Re and
Adelio Salsano},
title = {{FPGA} oriented design of parity sharing {RS} codecs},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {259--265},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.37},
doi = {10.1109/DFTVS.2005.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/CardarilliPRS05a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CellerePVB05,
author = {G. Cellere and
Alessandro Paccagnella and
Angelo Visconti and
Mauro Bonanomi},
title = {Soft Errors induced by single heavy ions in Floating Gate memory arrays},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {275--284},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.62},
doi = {10.1109/DFTVS.2005.62},
timestamp = {Sat, 22 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/CellerePVB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChapmanJB05,
author = {Glenn H. Chapman and
Vijay K. Jain and
Shekhar Bhansali},
title = {Inter-Plane Via Defect Detection Using the Sensor Plane in 3-D Heterogeneous
Sensor Systems},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {158--168},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.42},
doi = {10.1109/DFTVS.2005.42},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/ChapmanJB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChapmanKKDJ05,
author = {Glenn H. Chapman and
Israel Koren and
Zahava Koren and
Jozsef Dudas and
Cory Jung},
title = {On-Line Identification of Faults in Fault-Tolerant Imagers},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {149--157},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.54},
doi = {10.1109/DFTVS.2005.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChapmanKKDJ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChongO05,
author = {In Suk Chong and
Antonio Ortega},
title = {Hardware Testing For Error Tolerant Multimedia Compression based on
Linear Transforms},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {523--534},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.38},
doi = {10.1109/DFTVS.2005.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChongO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChungO05,
author = {Hyukjune Chung and
Antonio Ortega},
title = {Analysis and Testing for Error Tolerant Motion Estimation},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {514--522},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.19},
doi = {10.1109/DFTVS.2005.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChungO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DiLV05,
author = {Jia Di and
Parag K. Lala and
Dilip P. Vasudevan},
title = {On the Effect of Stuck-at Faults on Delay-insensitive Nanoscale Circuits},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {371--379},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.51},
doi = {10.1109/DFTVS.2005.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DiLV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/FazeliFM05,
author = {Mahdi Fazeli and
Reza Farivar and
Seyed Ghassem Miremadi},
title = {A Software-Based Concurrent Error Detection Technique for PowerPC
Processor-based Embedded Systems},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {266--274},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.14},
doi = {10.1109/DFTVS.2005.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/FazeliFM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/FukushiFH05,
author = {Masaru Fukushi and
Yusuke Fukushima and
Susumu Horiguchi},
title = {A Genetic Approach for the Reconfiguration of Degradable Processor
Arrays},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {63--71},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.7},
doi = {10.1109/DFTVS.2005.7},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/FukushiFH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GomezGC05,
author = {Roberto G{\'{o}}mez and
Alejandro Gir{\'{o}}n and
V{\'{\i}}ctor H. Champac},
title = {Test of Interconnection Opens Considering Coupling Signals},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {247--258},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.64},
doi = {10.1109/DFTVS.2005.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GomezGC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GrecuPWIS05,
author = {Cristian Grecu and
Partha Pratim Pande and
Baosheng Wang and
Andr{\'{e}} Ivanov and
Res Saleh},
title = {Methodologies and Algorithms for Testing Switch-Based NoC Interconnects},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {238--246},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.45},
doi = {10.1109/DFTVS.2005.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GrecuPWIS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HatzimihailPXGP05,
author = {Miltiadis Hatzimihail and
Mihalis Psarakis and
George Xenoulis and
Dimitris Gizopoulos and
Antonis M. Paschalis},
title = {Software-Based Self-Test for Pipelined Processors: {A} Case Study},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {535--543},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.63},
doi = {10.1109/DFTVS.2005.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HatzimihailPXGP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HoranG05,
author = {David M. Horan and
Richard A. Guinee},
title = {A Novel Pulse Echo Correlation Tool for Transmission Path Testing
and Fault Finding using Pseudorandom Binary Sequences},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {229--237},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.12},
doi = {10.1109/DFTVS.2005.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HoranG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/JungIH05,
author = {Cory Jung and
Mohammad Hadi Izadi and
Michelle L. La Haye},
title = {Noise Analysis of Fault Tolerant Active Pixel Sensors},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {140--148},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.48},
doi = {10.1109/DFTVS.2005.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/JungIH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Kaneko05,
author = {Haruhiko Kaneko},
title = {Error Control Coding for Semiconductor Memory Systems in the Space
Radiation Environment},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {93--101},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.34},
doi = {10.1109/DFTVS.2005.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Kaneko05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KimHKL05,
author = {Kyung Ki Kim and
Jing Huang and
Yong{-}Bin Kim and
Fabrizio Lombardi},
title = {On the Modeling and Analysis of Jitter in {ATE} Using Matlab},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {285--293},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.52},
doi = {10.1109/DFTVS.2005.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KimHKL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KimKL05,
author = {Kyung Ki Kim and
Yong{-}Bin Kim and
Fabrizio Lombardi},
title = {Data Dependent Jitter {(DDJ)} Characterization Methodology},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {294--304},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.25},
doi = {10.1109/DFTVS.2005.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KimKL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KitakamiS05,
author = {Masato Kitakami and
Manabu Sueishi},
title = {Fault-Tolerant Wormhole Switching with Backtracking Capability},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {505--513},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.35},
doi = {10.1109/DFTVS.2005.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KitakamiS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KumarT05,
author = {Jeetendra Kumar and
Mehdi Baradaran Tahoori},
title = {A Low Power Soft Error Suppression Technique for Dynamic Logic},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {454--462},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.9},
doi = {10.1109/DFTVS.2005.9},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KumarT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LeeT05,
author = {Jinkyu Lee and
Nur A. Touba},
title = {Low Power {BIST} Based on Scan Partitioning},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {33--41},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.43},
doi = {10.1109/DFTVS.2005.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LeeT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LeeTPP05,
author = {Jeremy Lee and
Mohammad Tehranipoor and
Chintan Patel and
Jim Plusquellic},
title = {Securing Scan Design Using Lock and Key Technique},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {51--62},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.58},
doi = {10.1109/DFTVS.2005.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LeeTPP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LeeWWW05,
author = {Leonard Lee and
Sean H. Wu and
Charles H.{-}P. Wen and
Li{-}C. Wang},
title = {On Generating Tests to Cover Diverse Worst-Case Timing Corners},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {415--426},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.50},
doi = {10.1109/DFTVS.2005.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LeeWWW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LiuVI05,
author = {Chunsheng Liu and
Kugesh Veeraraghavant and
Vikram Iyengar},
title = {Thermal-Aware Test Scheduling and Hot Spot Temperature Minimization
for Core-Based Systems},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {552--562},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.66},
doi = {10.1109/DFTVS.2005.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LiuVI05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LoWF05,
author = {Jien{-}Chung Lo and
Yu{-}Lun Wan and
Eiji Fujiwara},
title = {Transient Behavior of the Encoding/Decoding Circuits of Error Correcting
Codes},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {120--130},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.67},
doi = {10.1109/DFTVS.2005.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LoWF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MetraORCM05,
author = {Cecilia Metra and
Martin Oma{\~{n}}a and
Daniele Rossi and
Jos{\'{e}} Manuel Cazeaux and
T. M. Mak},
title = {The Other Side of the Timing Equation: a Result of Clock Faults},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {169--177},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.65},
doi = {10.1109/DFTVS.2005.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MetraORCM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Miura05,
author = {Yukiya Miura},
title = {Characteristics of Fault Diagnosis for Analog Circuits Based on Preset
Test},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {573--581},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.21},
doi = {10.1109/DFTVS.2005.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Miura05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MomenzadehHL05,
author = {Mariam Momenzadeh and
Jing Huang and
Fabrizio Lombardi},
title = {Defect Characterization and Tolerance of {QCA} Sequential Devices
and Circuits},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {199--207},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.26},
doi = {10.1109/DFTVS.2005.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MomenzadehHL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MomenzadehOL05,
author = {Mariam Momenzadeh and
Marco Ottavi and
Fabrizio Lombardi},
title = {Modeling {QCA} Defects at Molecular-level in Combinational Circuits},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {208--216},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.46},
doi = {10.1109/DFTVS.2005.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MomenzadehOL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/OstrovskyL05,
author = {Vladimir Ostrovsky and
Ilya Levin},
title = {Implementation of Concurrent Checking Circuits by Independent Sub-circuits},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {343--351},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.39},
doi = {10.1109/DFTVS.2005.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/OstrovskyL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PatitzPCM05,
author = {Zachary D. Patitz and
Nohpill Park and
Minsu Choi and
Fred J. Meyer},
title = {QCA-Based Majority Gate Design under Radius of Effect-Induced Faults},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {217--228},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.55},
doi = {10.1109/DFTVS.2005.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/PatitzPCM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PengM05,
author = {Song Peng and
Rajit Manohar},
title = {Efficient Failure Detection in Pipelined Asynchronous Circuits},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {484--493},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.33},
doi = {10.1109/DFTVS.2005.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/PengM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PomeranzR05,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {Recovery During Concurrent On-Line Testing of Identical Circuits},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {475--483},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.56},
doi = {10.1109/DFTVS.2005.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/PomeranzR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/QuanLW05,
author = {Shaolei Quan and
Meng{-}Yao Liu and
Chin{-}Long Wey},
title = {Design of a {CMOS} Operational Amplifier Amenable to Extreme Voltage
Stress},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {563--572},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.31},
doi = {10.1109/DFTVS.2005.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/QuanLW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RiahiNL05,
author = {Pedram A. Riahi and
Zainalabedin Navabi and
Fabrizio Lombardi},
title = {Simulating Faults of Combinational {IP} Core-based SOCs in a {PLI}
Environment},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {389--397},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.60},
doi = {10.1109/DFTVS.2005.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/RiahiNL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RossiOTM05,
author = {Daniele Rossi and
Martin Oma{\~{n}}a and
Fabio Toma and
Cecilia Metra},
title = {Multiple Transient Faults in Logic: An Issue for Next Generation ICs},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {352--360},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.47},
doi = {10.1109/DFTVS.2005.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/RossiOTM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SailletPN05,
author = {B. Saillet and
Jean{-}Michel Portal and
Didier N{\'{e}}e},
title = {Flash Memory Cell: Parametric Test Data Reconstruction for Process
Monitoring},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {131--139},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.36},
doi = {10.1109/DFTVS.2005.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SailletPN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SanchezRS05,
author = {Ernesto S{\'{a}}nchez and
Matteo Sonza Reorda and
Giovanni Squillero},
title = {On the Transformation of Manufacturing Test Sets into On-Line Test
Sets for Microprocessors},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {494--504},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.53},
doi = {10.1109/DFTVS.2005.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SanchezRS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SchulerC05,
author = {Erik Sch{\"{u}}ler and
Luigi Carro},
title = {Reliable Digital Circuits Design using Sigma-Delta Modulated Signals},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {314--324},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.57},
doi = {10.1109/DFTVS.2005.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SchulerC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SterponeV05,
author = {Luca Sterpone and
Massimo Violante},
title = {A design flow for protecting FPGA-based systems against single event
upsets},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {436--444},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.5},
doi = {10.1109/DFTVS.2005.5},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SterponeV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SuYW05,
author = {Chin{-}Lung Su and
Yi{-}Ting Yeh and
Cheng{-}Wen Wu},
title = {An Integrated {ECC} and Redundancy Repair Scheme for Memory Reliability
Enhancement},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {81--92},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.18},
doi = {10.1109/DFTVS.2005.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SuYW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TafajRAC05,
author = {Enkelejda Tafaj and
Paul M. Rosinger and
Bashir M. Al{-}Hashimi and
Krishnendu Chakrabarty},
title = {Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip
Using Shift Frequency Scaling},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {544--551},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.40},
doi = {10.1109/DFTVS.2005.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TafajRAC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Tahoori05,
author = {Mehdi Baradaran Tahoori},
title = {Defects, Yield, and Design in Sublithographic Nano-electronics},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {3--11},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.28},
doi = {10.1109/DFTVS.2005.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Tahoori05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Tehranipoor05,
author = {Mohammad Tehranipoor},
title = {Defect Tolerance for Molecular Electronics-Based NanoFabrics Using
Built-In Self-Test Procedure},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {305--313},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.27},
doi = {10.1109/DFTVS.2005.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Tehranipoor05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/VaidyaT05,
author = {Bhushan Vaidya and
Mehdi Baradaran Tahoori},
title = {Delay Test Generation with All Reachable Output Propagation and Multiple
Excitations},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {380--388},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.29},
doi = {10.1109/DFTVS.2005.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/VaidyaT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/VasudevanL05,
author = {Dilip P. Vasudevan and
Parag K. Lala},
title = {A Technique for Modular Design of Self-Checking Carry-Select Adder},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {325--333},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.15},
doi = {10.1109/DFTVS.2005.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/VasudevanL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/WardST05,
author = {Samuel I. Ward and
Chris Schattauer and
Nur A. Touba},
title = {Using Statistical Transformations to Improve Compression for Linear
Decompressors},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {42--50},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.68},
doi = {10.1109/DFTVS.2005.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/WardST05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/WieckowskiLDM05,
author = {Michael Wieckowski and
John C. Liobe and
Quentin Diduck and
Martin Margala},
title = {A New Test Methodology For {DNL} Error In Flash ADC's},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {582--590},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.11},
doi = {10.1109/DFTVS.2005.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/WieckowskiLDM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/WoKC05,
author = {Zhaojun Wo and
Israel Koren and
Maciej J. Ciesielski},
title = {An {ILP} Formulation for Yield-driven Architectural Synthesis},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {12--20},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.16},
doi = {10.1109/DFTVS.2005.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/WoKC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/WuW05,
author = {Lei Wu and
D. M. H. Walker},
title = {A Fast Algorithm for Critical Path Tracing in {VLSI} Digital Circuits},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {178--186},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.6},
doi = {10.1109/DFTVS.2005.6},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/WuW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/X05,
title = {Title Page},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.3},
doi = {10.1109/DFTVS.2005.3},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/X05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/X05a,
title = {Copyright},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.1},
doi = {10.1109/DFTVS.2005.1},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/X05a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/X05b,
title = {Message from the Symposium Chairs},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.44},
doi = {10.1109/DFTVS.2005.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/X05b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/X05c,
title = {Committees},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.22},
doi = {10.1109/DFTVS.2005.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/X05c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/XiongWJ05,
author = {Xingguo Xiong and
Yu{-}Liang Wu and
Wen{-}Ben Jone},
title = {Design and Analysis of Self-Repairable {MEMS} Accelerometer},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {21--32},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.30},
doi = {10.1109/DFTVS.2005.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/XiongWJ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/YuTHLLK05,
author = {Fang Yu and
Chung{-}Hung Tsai and
Yao{-}Wen Huang and
D. T. Lee and
Hung{-}Yau Lin and
Sy{-}Yen Kuo},
title = {Efficient Exact Spare Allocation via Boolean Satisfiability},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {361--370},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.32},
doi = {10.1109/DFTVS.2005.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/YuTHLLK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Zhang05,
author = {Wei Zhang},
title = {Computing Cache Vulnerability to Transient Errors and Its Implication},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {427--435},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.23},
doi = {10.1109/DFTVS.2005.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Zhang05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ZhangRP05,
author = {Zhuo Zhang and
Sudhakar M. Reddy and
Irith Pomeranz},
title = {On Generating Pseudo-Functional Delay Fault Tests for Scan Designs},
booktitle = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
pages = {398--405},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DFTVS.2005.49},
doi = {10.1109/DFTVS.2005.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ZhangRP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2005,
title = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://ieeexplore.ieee.org/xpl/conhome/10366/proceeding},
isbn = {0-7695-2464-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/2005.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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