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@inproceedings{DBLP:conf/ats/AlmuribKL11,
author = {Haider A. F. Almurib and
T. Nandha Kumar and
Fabrizio Lombardi},
title = {A Single-Configuration Method for Application-Dependent Testing of
SRAM-based {FPGA} Interconnects},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {444--450},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.12},
doi = {10.1109/ATS.2011.12},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/AlmuribKL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ArslanO11,
author = {Baris Arslan and
Alex Orailoglu},
title = {Adaptive Test Framework for Achieving Target Test Quality at Minimal
Cost},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {323--328},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.91},
doi = {10.1109/ATS.2011.91},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ArslanO11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AsianFLRH11,
author = {Manuel J. Barragan Asian and
Rafaella Fiorelli and
Gildas L{\'{e}}ger and
Adoraci{\'{o}}n Rueda and
Jos{\'{e}} L. Huertas},
title = {Improving the Accuracy of {RF} Alternate Test Using Multi-VDD Conditions:
Application to Envelope-Based Test of LNAs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {359--364},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.15},
doi = {10.1109/ATS.2011.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AsianFLRH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaoPCT11,
author = {Fang Bao and
Ke Peng and
Krishnendu Chakrabarty and
Mohammad Tehranipoor},
title = {On Generation of 1-Detect {TDF} Pattern Set with Significantly Increased
{SDD} Coverage},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {120--125},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.10},
doi = {10.1109/ATS.2011.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaoPCT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BernardiR11,
author = {Paolo Bernardi and
Matteo Sonza Reorda},
title = {A New Architecture to Cross-Fertilize On-Line and Manufacturing Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {142--147},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.42},
doi = {10.1109/ATS.2011.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BernardiR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhattaWC11,
author = {Debesh Bhatta and
Joshua W. Wells and
Abhijit Chatterjee},
title = {Time Domain Characterization and Test of High Speed Signals Using
Incoherent Sub-sampling},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.77},
doi = {10.1109/ATS.2011.77},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhattaWC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhattacharyaMSD11,
author = {Gunjan Bhattacharya and
Ilora Maity and
Biplab K. Sikdar and
Baisakhi Das},
title = {Exploring Impact of Faults on Branch Predictors' Power for Diagnosis
of Faulty Module},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {226--231},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.41},
doi = {10.1109/ATS.2011.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhattacharyaMSD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BosioDGTVMW11,
author = {Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Arnaud Virazel and
Kohei Miyase and
Xiaoqing Wen},
title = {Power-Aware Test Pattern Generation for At-Speed {LOS} Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {506--510},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.50},
doi = {10.1109/ATS.2011.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BosioDGTVMW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CarloGIRP11,
author = {Stefano Di Carlo and
Giulio Gambardella and
Marco Indaco and
Daniele Rolfo and
Paolo Prinetto},
title = {MarciaTesta: An Automatic Generator of Test Programs for Microprocessors'
Data Caches},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {401--406},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.78},
doi = {10.1109/ATS.2011.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CarloGIRP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaG11,
author = {Jae Chul Cha and
Sandeep K. Gupta},
title = {Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach
to Exploit Spares and {ECC} to Efficiently Combat High Defect and
Soft-Error Rates},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {126--135},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.71},
doi = {10.1109/ATS.2011.71},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChaG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChaKK11,
author = {Jaewon Cha and
Ilwoong Kim and
Sungho Kang},
title = {New Fault Detection Algorithm for Multi-level Cell Flash Memroies},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {341--346},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.13},
doi = {10.1109/ATS.2011.13},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChaKK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chakravarty11,
author = {Sreejit Chakravarty},
title = {A Process Monitor Based Speed Binning and Die Matching Algorithm},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {311--316},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.96},
doi = {10.1109/ATS.2011.96},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chakravarty11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChandraSK11,
author = {Anshuman Chandra and
Jyotirmoy Saikia and
Rohit Kapur},
title = {Breaking the Test Application Time Barriers in Compression: Adaptive
Scan-Cyclical {(AS-C)}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {432--437},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.70},
doi = {10.1109/ATS.2011.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChandraSK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenHLTCCL11,
author = {Po{-}Juei Chen and
Wei{-}Li Hsu and
James Chien{-}Mo Li and
Nan{-}Hsin Tseng and
Kuo{-}Yin Chen and
Wei{-}pin Changchien and
Charles C. C. Liu},
title = {An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay
Defects},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {291--296},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.23},
doi = {10.1109/ATS.2011.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenHLTCCL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenLXH11,
author = {Zhen Chen and
Jia Li and
Dong Xiang and
Yu Huang},
title = {Virtual Circuit Model for Low Power Scan Testing in Linear Decompressor-Based
Compression Environment},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {96--101},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.62},
doi = {10.1109/ATS.2011.62},
timestamp = {Thu, 25 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChenLXH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenSXB11,
author = {Zhen Chen and
Sharad C. Seth and
Dong Xiang and
Bhargab B. Bhattacharya},
title = {Diagnosis of Multiple Scan-Chain Faults in the Presence of System
Logic Defects},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {297--302},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.61},
doi = {10.1109/ATS.2011.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChenSXB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengZHLL11,
author = {Yuanqing Cheng and
Lei Zhang and
Yinhe Han and
Jun Liu and
Xiaowei Li},
title = {Wrapper Chain Design for Testing TSVs Minimization in Circuit-Partitioned
3D SoC},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {181--186},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.40},
doi = {10.1109/ATS.2011.40},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengZHLL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChiMGW11,
author = {Chun{-}Chuan Chi and
Erik Jan Marinissen and
Sandeep Kumar Goel and
Cheng{-}Wen Wu},
title = {Multi-visit TAMs to Reduce the Post-Bond Test Length of 2.5D-SICs
with a Passive Silicon Interposer Base},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {451--456},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.36},
doi = {10.1109/ATS.2011.36},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChiMGW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CookHIW11,
author = {Alejandro Cook and
Sybille Hellebrand and
Thomas Indlekofer and
Hans{-}Joachim Wunderlich},
title = {Diagnostic Test of Robust Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {285--290},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.55},
doi = {10.1109/ATS.2011.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CookHIW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DarbinyanHSVZ11,
author = {K. Darbinyan and
Gurgen Harutyunyan and
Samvel K. Shoukourian and
Valery A. Vardanian and
Yervant Zorian},
title = {A Robust Solution for Embedded Memory Test and Repair},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {461--462},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.98},
doi = {10.1109/ATS.2011.98},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DarbinyanHSVZ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DasG11,
author = {Prasanjeet Das and
Sandeep K. Gupta},
title = {On Generating Vectors for Accurate Post-Silicon Delay Characterization},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {251--260},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.39},
doi = {10.1109/ATS.2011.39},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/DasG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DeutschCKMKMG11,
author = {Sergej Deutsch and
Vivek Chickermane and
Brion L. Keller and
Subhasish Mukherjee and
Mario Konijnenburg and
Erik Jan Marinissen and
Sandeep Kumar Goel},
title = {Automation of 3D-DfT Insertion},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {395--400},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.58},
doi = {10.1109/ATS.2011.58},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DeutschCKMKMG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DevanathanBM11,
author = {V. R. Devanathan and
Sunil Bhavsar and
Rajat Mehrotra},
title = {Physical-Aware Memory {BIST} Datapath Synthesis: Architecture and
Case-Studies on Complex SoCs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {457--458},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.102},
doi = {10.1109/ATS.2011.102},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DevanathanBM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FanTRCB11,
author = {Xiaoxin Fan and
Huaxing Tang and
Sudhakar M. Reddy and
Wu{-}Tung Cheng and
Brady Benware},
title = {On Using Design Partitioning to Reduce Diagnosis Memory Footprint},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {219--225},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.45},
doi = {10.1109/ATS.2011.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FanTRCB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FangLL11,
author = {Yuntan Fang and
Huawei Li and
Xiaowei Li},
title = {A Fault Criticality Evaluation Framework of Digital Systems for Error
Tolerant Video Applications},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {329--334},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.72},
doi = {10.1109/ATS.2011.72},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/FangLL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FilipekFIMRTT11,
author = {Michal Filipek and
Yoshiaki Fukui and
Hiroyuki Iwata and
Grzegorz Mrugalski and
Janusz Rajski and
Masahiro Takakura and
Jerzy Tyszer},
title = {Low Power Decompressor and {PRPG} with Constant Value Broadcast},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {84--89},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.47},
doi = {10.1109/ATS.2011.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FilipekFIMRTT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FranzonDTM11,
author = {Paul D. Franzon and
W. Rhett Davis and
Thorlindur Thorolfsson and
Samson Melamed},
title = {3D Specific Systems: Design and {CAD}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {470--473},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.99},
doi = {10.1109/ATS.2011.99},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FranzonDTM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Fujita11,
author = {Masahiro Fujita},
title = {High Level Verification and Its Use at Pos-Silicon Debugging and Patching},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {464--469},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.51},
doi = {10.1109/ATS.2011.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Fujita11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoelGMPR11,
author = {Ashish Goel and
Swaroop Ghosh and
Mesut Meterelliyoz and
Jeff Parkhurst and
Kaushik Roy},
title = {Integrated Design {\&} Test: Conquering the Conflicting Requirements
of Low-Power, Variation-Tolerance and Test Cost},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {486--491},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.100},
doi = {10.1109/ATS.2011.100},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoelGMPR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GrayKWB11,
author = {Carl Gray and
David C. Keezer and
Howard Wang and
Keren Bergman},
title = {Burst-Mode Transmission and Data Recovery for Multi-GHz Optical Packet
Switching Network Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {545--551},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.81},
doi = {10.1109/ATS.2011.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GrayKWB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuerreiroS11,
author = {Nuno Guerreiro and
Marcelino B. Santos},
title = {Mixed-Signal Fault Equivalence: Search and Evaluation},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {377--382},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.19},
doi = {10.1109/ATS.2011.19},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuerreiroS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuptaG11,
author = {Puneet Gupta and
Rajesh K. Gupta},
title = {Underdesigned and Opportunistic Computing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {498--499},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.101},
doi = {10.1109/ATS.2011.101},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuptaG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GuptaKC11,
author = {Atul Gupta and
Ajay Kumar and
Manas Chhabra},
title = {Characterizing Pattern Dependent Delay Effects in {DDR} Memory Interfaces},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {425--431},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.14},
doi = {10.1109/ATS.2011.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GuptaKC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HamdiouiKIA11,
author = {Said Hamdioui and
Venkataraman Krishnaswami and
Ijeoma Sandra Irobi and
Zaid Al{-}Ars},
title = {A New Test Paradigm for Semiconductor Memories in the Nano-Era},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {347--352},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.87},
doi = {10.1109/ATS.2011.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HamdiouiKIA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HamdiouiT11,
author = {Said Hamdioui and
Mottaqiallah Taouil},
title = {Yield Improvement and Test Cost Optimization for 3D Stacked ICs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {480--485},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.88},
doi = {10.1109/ATS.2011.88},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HamdiouiT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HaronHH11,
author = {Nor Zaidi Haron and
Said Hamdioui},
title = {On Defect Oriented Testing for Hybrid CMOS/Memristor Memory},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {353--358},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.66},
doi = {10.1109/ATS.2011.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HaronHH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiFSKT11,
author = {Yoshinobu Higami and
Hiroshi Furutani and
Takao Sakai and
Shuichi Kameyama and
Hiroshi Takahashi},
title = {Test Pattern Selection for Defect-Aware Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {102--107},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.24},
doi = {10.1109/ATS.2011.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiFSKT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiTKS11,
author = {Yoshinobu Higami and
Hiroshi Takahashi and
Shin{-}ya Kobayashi and
Kewal K. Saluja},
title = {On Detecting Transition Faults in the Presence of Clock Delay Faults},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.33},
doi = {10.1109/ATS.2011.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HigamiTKS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangHLHLL11,
author = {Keheng Huang and
Yu Hu and
Xiaowei Li and
Gengxin Hua and
Hongjin Liu and
Bo Liu},
title = {Exploiting Free {LUT} Entries to Mitigate Soft Errors in SRAM-based
FPGAs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {438--443},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.25},
doi = {10.1109/ATS.2011.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangHLHLL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaIYI11,
author = {Hideyuki Ichihara and
Yuka Iwamoto and
Yuki Yoshikawa and
Tomoo Inoue},
title = {Test Compression Based on Lossy Image Encoding},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {273--278},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.59},
doi = {10.1109/ATS.2011.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaIYI11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IrobiAHT11,
author = {Sandra Irobi and
Zaid Al{-}Ars and
Said Hamdioui and
Claude Thibeault},
title = {Testing for Parasitic Memory Effect in SRAMs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {407--412},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.76},
doi = {10.1109/ATS.2011.76},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IrobiAHT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IshaqJSP11,
author = {Umair Ishaq and
Jihun Jung and
Jaehoon Song and
Sungju Park},
title = {Efficient Use of Unused Spare Columns to Improve Memory Error Correcting
Rate},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {335--340},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.28},
doi = {10.1109/ATS.2011.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IshaqJSP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JangCGNA11,
author = {Eun Jung Jang and
Jaeyong Chung and
Anne E. Gattiker and
Sani R. Nassif and
Jacob A. Abraham},
title = {Post-Silicon Timing Validation Method Using Path Delay Measurements},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {232--237},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.32},
doi = {10.1109/ATS.2011.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JangCGNA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JavaheriNKN11,
author = {Fatemeh Javaheri and
Majid Namaki{-}Shoushtari and
Parastoo Kamranfar and
Zainalabedin Navabi},
title = {Mapping Transaction Level Faults to Stuck-At Faults in Communication
Hardware},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {114--119},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.94},
doi = {10.1109/ATS.2011.94},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JavaheriNKN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KarimiKCGP11,
author = {Naghmeh Karimi and
Zhiqiu Kong and
Krishnendu Chakrabarty and
Pallav Gupta and
Srinivas Patil},
title = {Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {7--14},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.68},
doi = {10.1109/ATS.2011.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KarimiKCGP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KavousianosCJP11,
author = {Xrysovalantis Kavousianos and
Krishnendu Chakrabarty and
Arvind Jain and
Rubin A. Parekhji},
title = {Test Scheduling for Multicore SoCs with Dynamic Voltage Scaling and
Multiple Voltage Islands},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {33--39},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.53},
doi = {10.1109/ATS.2011.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KavousianosCJP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KhodabandelooHTHBN11,
author = {Behnam Khodabandeloo and
Seyyed Alireza Hoseini and
Sajjad Taheri and
Mohammad Hashem Haghbayan and
Mahmood Reza Babaei and
Zainalabedin Navabi},
title = {Online Test Macro Scheduling and Assignment in MPSoC Design},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {148--153},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.95},
doi = {10.1109/ATS.2011.95},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KhodabandelooHTHBN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KhullarB11,
author = {Shray Khullar and
Swapnil Bahl},
title = {Power Aware Shift and Capture {ATPG} Methodology for Low Power Designs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {500--505},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.65},
doi = {10.1109/ATS.2011.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KhullarB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimA11,
author = {Hyunjin Kim and
Jacob A. Abraham},
title = {On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing
Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {15--20},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.31},
doi = {10.1109/ATS.2011.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KimA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KirmsePP11,
author = {Matthias Kirmse and
Uwe Petersohn and
Elief Paffrath},
title = {Optimized Test Error Detection by Probabilistic Retest Recommendation
Models},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {317--322},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.11},
doi = {10.1109/ATS.2011.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KirmsePP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteKMWW11,
author = {Michael A. Kochte and
Sandip Kundu and
Kohei Miyase and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Efficient BDD-based Fault Simulation in Presence of Unknown Values},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {383--388},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.52},
doi = {10.1109/ATS.2011.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteKMWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KomuravelliMBD11,
author = {Anvesh Komuravelli and
Srobona Mitra and
Ansuman Banerjee and
Pallab Dasgupta},
title = {Backward Reasoning with Formal Properties: {A} Methodology for Bug
Isolation on Simulation Traces},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {238--243},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.54},
doi = {10.1109/ATS.2011.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KomuravelliMBD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LegatBN11,
author = {Uros Legat and
Anton Biasizzo and
Franc Novak},
title = {Soft Error Recovery Technique for Multiprocessor {SOPC}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {175--180},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.22},
doi = {10.1109/ATS.2011.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LegatBN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinMMNRT11,
author = {Xijiang Lin and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Benoit Nadeau{-}Dostie and
Janusz Rajski and
Jerzy Tyszer},
title = {Power Aware Embedded Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {511--516},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.49},
doi = {10.1109/ATS.2011.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinMMNRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiyaseUEYWKWDBGV11,
author = {Kohei Miyase and
Y. Uchinodan and
Kazunari Enokimoto and
Yuta Yamato and
Xiaoqing Wen and
Seiji Kajihara and
Fangmei Wu and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Arnaud Virazel},
title = {Effective Launch-to-Capture Power Reduction for {LOS} Scheme with
Adjacent-Probability-Based X-Filling},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {90--95},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.35},
doi = {10.1109/ATS.2011.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiyaseUEYWKWDBGV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoghaddamRRJ11,
author = {Elham K. Moghaddam and
Janusz Rajski and
Sudhakar M. Reddy and
Jakub Janicki},
title = {Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {267--272},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.46},
doi = {10.1109/ATS.2011.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoghaddamRRJ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MrugalskiPMRTU11,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Pawel Urbanek},
title = {Fault Diagnosis in Memory {BIST} Environment with Non-march Tests},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {419--424},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.48},
doi = {10.1109/ATS.2011.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MrugalskiPMRTU11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MukhopadhyayC11,
author = {Debdeep Mukhopadhyay and
Rajat Subhra Chakraborty},
title = {Testability of Cryptographic Hardware and Detection of Hardware Trojans},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {517--524},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.27},
doi = {10.1109/ATS.2011.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MukhopadhyayC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MumtazIHW11,
author = {Abdullah Mumtaz and
Michael E. Imhof and
Stefan Holst and
Hans{-}Joachim Wunderlich},
title = {Embedded Test for Highly Accurate Defect Localization},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {213--218},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.60},
doi = {10.1109/ATS.2011.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MumtazIHW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NatarajanWCS11,
author = {Jayaram Natarajan and
Joshua W. Wells and
Abhijit Chatterjee and
Adit D. Singh},
title = {Distributed Comparison Test Driven Multiprocessor Speed-Tuning: Targeting
Performance Gains under Extreme Process Variations},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {154--160},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.84},
doi = {10.1109/ATS.2011.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NatarajanWCS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NematiN11,
author = {Nastaran Nemati and
Zainalabedin Navabi},
title = {Adaptation of Standard {RT} Level {BIST} Architectures for System
Level Communication Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {72--77},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.103},
doi = {10.1109/ATS.2011.103},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NematiN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NoiaC11,
author = {Brandon Noia and
Krishnendu Chakrabarty},
title = {Identification of Defective TSVs in Pre-Bond Testing of 3D ICs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {187--194},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.57},
doi = {10.1109/ATS.2011.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NoiaC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NoiaC11a,
author = {Brandon Noia and
Krishnendu Chakrabarty},
title = {Testing and Design-for-Testability Techniques for 3D Integrated Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {474--479},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.67},
doi = {10.1109/ATS.2011.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NoiaC11a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Onodera11,
author = {Hidetoshi Onodera},
title = {Dependable {VLSI} Program in Japan: Program Overview and the Current
Status of Dependable {VLSI} Platform Project},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {492--495},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.56},
doi = {10.1109/ATS.2011.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Onodera11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PaiGCCL11,
author = {Chih{-}Yun Pai and
Ruei{-}Ting Gu and
Bo{-}Chuan Cheng and
Liang{-}Bi Chen and
Katherine Shu{-}Min Li},
title = {A Unified Interconnects Testing Scheme for 3D Integrated Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {195--200},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.38},
doi = {10.1109/ATS.2011.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PaiGCCL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PrabhuHKLGG11,
author = {Sarvesh Prabhu and
Michael S. Hsiao and
Saparya Krishnamoorthy and
Loganathan Lingappan and
Vijay Gangaram and
Jim Grundy},
title = {An Efficient 2-Phase Strategy to Achieve High Branch Coverage},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {167--174},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.83},
doi = {10.1109/ATS.2011.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PrabhuHKLGG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/QianSC11,
author = {Xi Qian and
Adit D. Singh and
Abhijit Chatterjee},
title = {Diagnosing Multiple Slow Gates for Performance Tuning in the Face
of Extreme Process Variations},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {303--310},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.73},
doi = {10.1109/ATS.2011.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/QianSC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RazzaqSS11,
author = {Mohammed Abdul Razzaq and
Virendra Singh and
Adit D. Singh},
title = {{SSTKR:} Secure and Testable Scan Design through Test Key Randomization},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {60--65},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.85},
doi = {10.1109/ATS.2011.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RazzaqSS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RodriguesK11,
author = {Rance Rodrigues and
Sandip Kundu},
title = {An Online Mechanism to Verify Datapath Execution Using Existing Resources
in Chip Multiprocessors},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.82},
doi = {10.1109/ATS.2011.82},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RodriguesK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SaikiaNKAUFBK11,
author = {Jyotirmoy Saikia and
Pramod Notiyath and
Santosh Kulkarni and
Ashok Anbalan and
Rajesh Uppuluri and
Tammy Fernandes and
Parthajit Bhattacharya and
Rohit Kapur},
title = {Predicting Scan Compression {IP} Configurations for Better QoR},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {261--266},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.30},
doi = {10.1109/ATS.2011.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SaikiaNKAUFBK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoYMK11,
author = {Yasuo Sato and
Hisato Yamaguchi and
Makoto Matsuzono and
Seiji Kajihara},
title = {Multi-cycle Test with Partial Observation on Scan-Based {BIST} Structure},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {54--59},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.34},
doi = {10.1109/ATS.2011.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoYMK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SauerJCPB11,
author = {Matthias Sauer and
Jie Jiang and
Alejandro Czutro and
Ilia Polian and
Bernd Becker},
title = {Efficient SAT-Based Search for Longest Sensitisable Paths},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {108--113},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.43},
doi = {10.1109/ATS.2011.43},
timestamp = {Thu, 11 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/SauerJCPB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Sinanoglu11,
author = {Ozgur Sinanoglu},
title = {Rewind-Support for Peak Capture Power Reduction in Launch-Off-Shift
Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {78--83},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.18},
doi = {10.1109/ATS.2011.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Sinanoglu11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SindiaAS11,
author = {Suraj Sindia and
Vishwani D. Agrawal and
Virendra Singh},
title = {Test and Diagnosis of Analog Circuits Using Moment Generating Functions},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {371--376},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.86},
doi = {10.1109/ATS.2011.86},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SindiaAS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SpyronasiosASM11,
author = {Alexios Spyronasios and
Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {On Replacing an {RF} Test with an Alternative Measurement: Theory
and a Case Study},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {365--370},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.44},
doi = {10.1109/ATS.2011.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SpyronasiosASM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TenentesK11,
author = {Vasileios Tenentes and
Xrysovalantis Kavousianos},
title = {Low Power Test-Compression for High Test-Quality and Low Test-Data
Volume},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {46--53},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.75},
doi = {10.1109/ATS.2011.75},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TenentesK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TranVBDGPW11,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
title = {A Hybrid Fault Tolerant Architecture for Robustness Improvement of
Digital Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {136--141},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.89},
doi = {10.1109/ATS.2011.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TranVBDGPW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsertovUJD11,
author = {Anton Tsertov and
Raimund Ubar and
Artur Jutman and
Sergei Devadze},
title = {Automatic SoC Level Test Path Synthesis Based on Partial Functional
Models},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {532--538},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.79},
doi = {10.1109/ATS.2011.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsertovUJD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/VatajeluGRF11,
author = {Elena I. Vatajelu and
{\'{A}}lvaro G{\'{o}}mez{-}Pau and
Michel Renovell and
Joan Figueras},
title = {Transient Noise Failures in {SRAM} Cells: Dynamic Noise Margin Metric},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {413--418},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.64},
doi = {10.1109/ATS.2011.64},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/VatajeluGRF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Wehn11,
author = {Norbert Wehn},
title = {Reliability: {A} Cross-Disciplinary and Cross-Layer Approach},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {496--497},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.21},
doi = {10.1109/ATS.2011.21},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Wehn11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XiangC11,
author = {Dong Xiang and
Zhen Chen},
title = {Selective Test Response Collection for Low-Power Scan Testing with
Well-Compressed Test Data},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {40--45},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.74},
doi = {10.1109/ATS.2011.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XiangC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YaoSR11,
author = {Chunhua Yao and
Kewal K. Saluja and
Parameswaran Ramanathan},
title = {Temperature Dependent Test Scheduling for Multi-core System-on-Chip},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {27--32},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.26},
doi = {10.1109/ATS.2011.26},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YaoSR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YotsuyanagiMH11,
author = {Hiroyuki Yotsuyanagi and
Hiroyuki Makimoto and
Masaki Hashizume},
title = {A Boundary Scan Circuit with Time-to-Digital Converter for Delay Testing},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {539--544},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.63},
doi = {10.1109/ATS.2011.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YotsuyanagiMH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YuXQ11,
author = {Yang Yu and
Gang Xi and
Liyan Qiao},
title = {Multiscan-based Test Data Compression Using {UBI} Dictionary and Bitmask},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {279--284},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.69},
doi = {10.1109/ATS.2011.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YuXQ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZadeganIACL11,
author = {Farrokh Ghani Zadegan and
Urban Ingelsson and
Golnaz Asani and
Gunnar Carlsson and
Erik Larsson},
title = {Test Scheduling in an {IEEE} {P1687} Environment with Resource and
Power Constraints},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {525--531},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.80},
doi = {10.1109/ATS.2011.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZadeganIACL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZaourarKA11,
author = {Lilia Zaourar and
Yann Kieffer and
Chouki Aktouf},
title = {An Innovative Methodology for Scan Chain Insertion and Analysis at
{RTL}},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {66--71},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.20},
doi = {10.1109/ATS.2011.20},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZaourarKA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZeidlerWKVK11,
author = {Steffen Zeidler and
Christoph Wolf and
Milos Krstic and
Frank Vater and
Rolf Kraemer},
title = {Design of a Test Processor for Asynchronous Chip Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {244--250},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.17},
doi = {10.1109/ATS.2011.17},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZeidlerWKVK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangWD11,
author = {Hongyan Zhang and
Robert Wille and
Rolf Drechsler},
title = {Improved Fault Diagnosis for Reversible Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.29},
doi = {10.1109/ATS.2011.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangWD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoKA11,
author = {Yi Zhao and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi},
title = {Cost-Effective {TSV} Grouping for Yield Improvement of 3D-ICs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {201--206},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.37},
doi = {10.1109/ATS.2011.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhaoKA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhongKARC11,
author = {Shida Zhong and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi and
Sudhakar M. Reddy and
Krishnendu Chakrabarty},
title = {Analysis of Resistive Bridge Defect Delay Behavior in the Presence
of Process Variation},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {389--394},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.16},
doi = {10.1109/ATS.2011.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhongKARC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZordanBDGPTVB11,
author = {Leonardo Bonet Zordan and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Aida Todri and
Arnaud Virazel and
Nabil Badereddine},
title = {Failure Analysis and Test Solutions for Low-Power SRAMs},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {459--460},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.97},
doi = {10.1109/ATS.2011.97},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZordanBDGPTVB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/dAbreu11,
author = {Manuel A. d'Abreu},
title = {Nand Flash Memory - Product Trends, Technology Overview, and Technical
Challenges},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {463},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.90},
doi = {10.1109/ATS.2011.90},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/dAbreu11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2011,
title = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://ieeexplore.ieee.org/xpl/conhome/6114262/proceeding},
isbn = {978-1-4577-1984-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/2011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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