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"Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis."

Wen-Ben Jone et al. (2001)

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DOI: 10.1155/2001/28741

access: open

type: Journal Article

metadata version: 2023-05-08

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  dblp key:
  - journals/vlsi/JonesHCD01
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  - https://dblp.org/rec/journals/vlsi/JonesHCD01
Wen-Ben Jone, Der-Cheng Huang, Shih-Chieh Chang, Sunil R. Das:
Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis. VLSI Design 12(4): 457-474 (2001)

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