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"PGEN: A Novel Approach to Sequential Circuit Test Generation."

Wen-Ben Jone et al. (1996)

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DOI: 10.1155/1996/68463

access: open

type: Journal Article

metadata version: 2022-11-07

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  dblp key:
  - journals/vlsi/JoneSGD96
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  persistent URL:
  - https://dblp.org/rec/journals/vlsi/JoneSGD96
Wen-Ben Jone, Nigam Shah, Anita Gleason, Sunil R. Das:
PGEN: A Novel Approach to Sequential Circuit Test Generation. VLSI Design 4(3): 149-165 (1996)

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