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"Testing Methodology of Embedded DRAMs."

Hao-Yu Yang et al. (2012)

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DOI: 10.1109/TVLSI.2011.2161785

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/YangCCHL12
Hao-Yu Yang, Chi-Min Chang, Mango Chia-Tso Chao, Rei-Fu Huang, Shih-Chin Lin:
Testing Methodology of Embedded DRAMs. IEEE Trans. Very Large Scale Integr. Syst. 20(9): 1715-1728 (2012)

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