"Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown ..."

Yi-Da Wu et al. (2020)

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DOI: 10.1109/TVLSI.2020.3017950

access: closed

type: Journal Article

metadata version: 2021-09-01

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Yi-Da Wu, Kexin Yang, Shu-Han Hsu, Linda Milor:
Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation. IEEE Trans. Very Large Scale Integr. Syst. 28(12): 2658-2671 (2020)

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