"EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned ..."

Andrew Stern et al. (2020)

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DOI: 10.1109/TVLSI.2019.2949733

access: closed

type: Journal Article

metadata version: 2021-11-30

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Andrew Stern, Ulbert Botero, Fahim Rahman, Domenic Forte, Mark M. Tehranipoor:
EMFORCED: EM-Based Fingerprinting Framework for Remarked and Cloned Counterfeit IC Detection Using Machine Learning Classification. IEEE Trans. Very Large Scale Integr. Syst. 28(2): 363-375 (2020)

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