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"Test Pattern Generation for Multiple Aggressor Crosstalk Effects ..."

Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu (2012)

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DOI: 10.1109/TVLSI.2011.2106169

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/SanyalGK12
Alodeep Sanyal, Kunal P. Ganeshpure, Sandip Kundu:
Test Pattern Generation for Multiple Aggressor Crosstalk Effects Considering Gate Leakage Loading in Presence of Gate Delays. IEEE Trans. Very Large Scale Integr. Syst. 20(3): 424-436 (2012)

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