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"A Simplified Yield Model for SRAM Repair in Advanced Technology."

Xiaoyuan Qi et al. (2018)

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DOI: 10.1109/TVLSI.2018.2858561

access: closed

type: Journal Article

metadata version: 2020-03-11

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  dblp key:
  - journals/tvlsi/QiRHHMSNAL18
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/QiRHHMSNAL18
Xiaoyuan Qi, Raymond J. Rosner, John Hopkins, Jack M. Higman, Rick Mewhirter, Aaron Sinnott, Binod Kumar G. Nair, Ishtiaq Ahsan, Mark Lagus:
A Simplified Yield Model for SRAM Repair in Advanced Technology. IEEE Trans. Very Large Scale Integr. Syst. 26(11): 2494-2503 (2018)

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