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"Test Sequences for Faults in the Scan Logic."

Irith Pomeranz (2022)

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DOI: 10.1109/TVLSI.2022.3182540

access: closed

type: Journal Article

metadata version: 2022-10-18

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Irith Pomeranz:
Test Sequences for Faults in the Scan Logic. IEEE Trans. Very Large Scale Integr. Syst. 30(10): 1568-1572 (2022)

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