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"Reduced Power Transition Fault Test Sets for Circuits With Independent ..."

Irith Pomeranz (2013)

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DOI: 10.1109/TVLSI.2012.2207137

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/Pomeranz13c
Irith Pomeranz:
Reduced Power Transition Fault Test Sets for Circuits With Independent Scan Chain Modes. IEEE Trans. Very Large Scale Integr. Syst. 21(7): 1354-1359 (2013)

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