"Flip-Flop Selection for Partial Enhanced Scan to Reduce Transition Test ..."

Songwei Pei, Huawei Li, Xiaowei Li (2012)

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DOI: 10.1109/TVLSI.2011.2170227

access: closed

type: Journal Article

metadata version: 2023-05-11

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Songwei Pei, Huawei Li, Xiaowei Li:
Flip-Flop Selection for Partial Enhanced Scan to Reduce Transition Test Data Volume. IEEE Trans. Very Large Scale Integr. Syst. 20(12): 2157-2169 (2012)

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