"Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes."

Feng Liang et al. (2013)

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DOI: 10.1109/TVLSI.2012.2195689

access: closed

type: Journal Article

metadata version: 2021-08-30

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Feng Liang, Luwen Zhang, Shaochong Lei, Guohe Zhang, Kaile Gao, Bin Liang:
Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes. IEEE Trans. Very Large Scale Integr. Syst. 21(4): 614-623 (2013)

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