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"Reliability Modeling and Management of Nanophotonic On-Chip Networks."

Zheng Li et al. (2012)

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DOI: 10.1109/TVLSI.2010.2089072

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/LiMCDMSMJVSS12
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/LiMCDMSMJVSS12
Zheng Li, Moustafa Mohamed, Xi Chen, Eric Dudley, Ke Meng, Li Shang, Alan Rolf Mickelson, Russ Joseph, Manish Vachharajani, Brian Schwartz, Yihe Sun:
Reliability Modeling and Management of Nanophotonic On-Chip Networks. IEEE Trans. Very Large Scale Integr. Syst. 20(1): 98-111 (2012)

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