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"Modeling and Detectability of Full Open Gate Defects in FinFET Technology."

Freddy Forero et al. (2019)

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DOI: 10.1109/TVLSI.2019.2918768

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/ForeroVRC19
Freddy Forero, Hector Villacorta, Michel Renovell, Víctor H. Champac:
Modeling and Detectability of Full Open Gate Defects in FinFET Technology. IEEE Trans. Very Large Scale Integr. Syst. 27(9): 2180-2190 (2019)

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