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"Built-in redundancy analysis for memory yield improvement."

Chih-Tsun Huang et al. (2003)

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DOI: 10.1109/TR.2003.821925

access: closed

type: Journal Article

metadata version: 2023-10-17

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Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu:
Built-in redundancy analysis for memory yield improvement. IEEE Trans. Reliab. 52(4): 386-399 (2003)

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