"An Automated Measurement System for the Characterization of Electron ..."

Antonio Raffo et al. (2009)

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DOI: 10.1109/TIM.2009.2015696

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/RaffoGTSV09
Antonio Raffo, Valeria Di Giacomo, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini:
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime. IEEE Trans. Instrum. Meas. 58(8): 2663-2670 (2009)

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