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"An Automated Measurement System for the Characterization of Electron ..."
Antonio Raffo et al. (2009)
- Antonio Raffo, Valeria Di Giacomo, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini:
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime. IEEE Trans. Instrum. Meas. 58(8): 2663-2670 (2009)
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