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2020 – today
- 2024
[j9]Ken Kikuchi
, Antonio Raffo, Valeria Vadalà, Gianni Bosi, Giorgio Vannini, Hiroshi Yamamoto:
A New Calibration Technique of Electromagnetic Simulators for Accurate Analyses of Microwave Components on Epitaxial Wafers. IEEE Access 12: 72721-72729 (2024)- [j8]Xiaoqiang Tang, Antonio Raffo, Nicola Donato, Giovanni Crupi, Jialin Cai:
Theoretical and Experimental Analysis of a CSWPL Behavioral Model for Microwave GaN Transistors Including DC Bias Voltages. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(3): 933-943 (2024) - 2023
- [c10]Jialin Cai, Giovanni Gugliandolo, Zlatica Marinkovic, Mariangela Latino, Enza Fazio, Gianni Bosi, Antonio Raffo, Giovanni Crupi, Nicola Donato:
GaN HEMT Small-Signal Modeling Using an Optimization Strategy Based on Gated Recurrent Unit Networks. MetroXRAINE 2023: 422-426 - 2022
- [j7]Hiroshi Yamamoto, Ken Kikuchi, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini:
Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers. IEICE Trans. Electron. 105-C(10): 449-456 (2022)
2010 – 2019
- 2018
- [j6]Sandra Costanzo, Francesca Venneri, Antonio Raffo, Giuseppe Di Massa:
Dual-Layer Single-Varactor Driven Reflectarray Cell for Broad-Band Beam-Steering and Frequency Tunable Applications. IEEE Access 6: 71793-71800 (2018) - [c9]Hiroshi Yamamoto, Ken Kikuchi, Norihiko Ui, Kazutaka Inoue, Valeria Vadalà, Gianni Bosi, Antonio Raffo, Giorgio Vannini:
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers. BCICTS 2018: 44-47 - [c8]Antonio Raffo, Sandra Costanzo, Vincenzo Cioffi:
Quadrature Receiver Benefits in CW Doppler Radar Sensors for Vibrations Detection. WorldCIST (2) 2018: 1471-1477 - [c7]Sandra Costanzo, Vincenzo Cioffi, Antonio Raffo:
Complex Permittivity Effect on the Performances of Non-invasive Microwave Blood Glucose Sensing: Enhanced Model and Preliminary Results. WorldCIST (2) 2018: 1505-1511 - 2017
- [j5]Antonio Raffo, Sandra Costanzo, Giuseppe Di Massa:
Software Defined Doppler Radar as a Contactless Multipurpose Microwave Sensor for Vibrations Monitoring. Sensors 17(1): 115 (2017) - [c6]Gianni Bosi, Antonio Raffo, Giorgio Vannini, Gustavo Avolio, Dominique Schreurs:
Impact of transistor model uncertainty on microwave load-pull simulations. I2MTC 2017: 1-6 - [c5]Antonio Raffo, Sandra Costanzo:
Doppler Elaboration for Vibrations Detection Using Software Defined Radar. WorldCIST (2) 2017: 1022-1028 - 2016
- [c4]Sandra Costanzo, Antonio Costanzo, Antonio Raffo, Antonio Borgia:
Environmental Effects on the Performances of a UHF Passive Tag-Based Commercial RFID System. WorldCIST (2) 2016: 317-323 - [c3]Sandra Costanzo, Giuseppe Di Massa, Antonio Costanzo, Antonio Borgia, Antonio Raffo, Giuseppe Viggiani, Pasquale Versace:
Software-Defined Radar System for Landslides Monitoring. WorldCIST (2) 2016: 325-331 - 2015
- [c2]Sandra Costanzo, Francesca Venneri, Antonio Raffo, Giuseppe Di Massa, Pasquale Corsonello:
Novel Varactor-Loaded Phasing Line for Reflectarray Unit Cell with Large Reconfigurability Frequency Range. WorldCIST (2) 2015: 3-9 - [c1]Sandra Costanzo, Giuseppe Di Massa, Antonio Costanzo, Luca Morrone, Antonio Raffo, Francesco Spadafora, Antonio Borgia, Giuseppe Formetta, Giovanna Capparelli, Pasquale Versace:
Low-Cost Radars Integrated into a Landslide Early Warning System. WorldCIST (2) 2015: 11-19 - 2011
- [j4]Antonio Raffo, Valeria Vadalà, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini, Fabio Filicori:
A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices. Comput. Stand. Interfaces 33(2): 165-175 (2011) - [j3]Antonio Raffo, Sergio Di Falco, Giovanna Sozzi, Roberto Menozzi, Dominique M. M.-P. Schreurs, Giorgio Vannini:
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime. Microelectron. Reliab. 51(2): 235-239 (2011)
2000 – 2009
- 2009
- [j2]Antonio Raffo, Valeria Di Giacomo, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini:
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime. IEEE Trans. Instrum. Meas. 58(8): 2663-2670 (2009) - 2006
- [b1]Antonio Raffo:
Nonlinear modelling of low-frequency dispersive effects in microwave electron devices. University of Ferrara, Italy, 2006 - [j1]Pier Andrea Traverso, Antonio Raffo, Massimo Pirazzini, Alberto Santarelli, Fabio Filicori:
Automated microwave-device characterization setup based on a technology-independent generalized bias system. IEEE Trans. Instrum. Meas. 55(4): 1390-1396 (2006)
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