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"Parity bit signature in response data compaction and built-in self-testing ..."

Sunil R. Das et al. (2003)

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DOI: 10.1109/TIM.2003.818547

access: closed

type: Journal Article

metadata version: 2022-11-24

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Sunil R. Das, Made Sudarma, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Krishnendu Chakrabarty, Mehmet Sahinoglu:
Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets. IEEE Trans. Instrum. Meas. 52(5): 1363-1380 (2003)

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