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"Fault simulation and response compaction in full scan circuits using HOPE."
Sunil R. Das et al. (2005)
- Sunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu:
Fault simulation and response compaction in full scan circuits using HOPE. IEEE Trans. Instrum. Meas. 54(6): 2310-2328 (2005)
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