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"Revisiting response compaction in space for full-scan circuits with ..."
Sunil R. Das et al. (2005)
- Sunil R. Das, Chittoor V. Ramamoorthy, Mansour H. Assaf
, Emil M. Petriu, Wen-Ben Jone, Mehmet Sahinoglu:
Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization. IEEE Trans. Instrum. Meas. 54(5): 1662-1677 (2005)
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