Stop the war!
Остановите войну!
for scientists:
default search action
"Guest Editorial First Special Section of the IEEE TRANSACTIONS ON ..."
Sunil R. Das, Rochit Rajsuman (2005)
- Sunil R. Das, Rochit Rajsuman:
Guest Editorial First Special Section of the IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT in the Area of VLSI Testing - Future of Semiconductor Test. IEEE Trans. Instrum. Meas. 54(5): 1659-1661 (2005)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.