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"Clock Period-Jitter Measurement With Low-Noise Runtime Calibration for ..."

Jinn-Shyan Wang, Pei-Yuan Chou (2024)

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DOI: 10.1109/TCSI.2024.3375396

access: closed

type: Journal Article

metadata version: 2024-07-19

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Jinn-Shyan Wang, Pei-Yuan Chou:
Clock Period-Jitter Measurement With Low-Noise Runtime Calibration for Chips in FinFET CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 71(7): 3157-3164 (2024)

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