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"Fault Modeling and Efficient Testing of Memristor-Based Memory."

Peng Liu et al. (2021)

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DOI: 10.1109/TCSI.2021.3098639

access: closed

type: Journal Article

metadata version: 2023-05-23

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  - https://dblp.org/rec/journals/tcasI/LiuYWLHC21
Peng Liu, Zhiqiang You, Jigang Wu, Bosheng Liu, Yinhe Han, Krishnendu Chakrabarty:
Fault Modeling and Efficient Testing of Memristor-Based Memory. IEEE Trans. Circuits Syst. I Regul. Pap. 68(11): 4444-4455 (2021)

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