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"Random Flip Bit Aware Reading for Improving High-Density 3-D NAND Flash ..."

Hua Feng et al. (2024)

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DOI: 10.1109/TCSI.2024.3366902

access: closed

type: Journal Article

metadata version: 2024-05-17

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Hua Feng, Debao Wei, Shipeng Gu, Zhelong Piao, Yongchao Wang, Liyan Qiao:
Random Flip Bit Aware Reading for Improving High-Density 3-D NAND Flash Performance. IEEE Trans. Circuits Syst. I Regul. Pap. 71(5): 2372-2383 (2024)

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