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"Linear model-based testing of ADC nonlinearities."

Carsten Wegener, Michael Peter Kennedy (2004)

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DOI: 10.1109/TCSI.2003.821281

access: closed

type: Journal Article

metadata version: 2020-05-22

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Carsten Wegener, Michael Peter Kennedy:
Linear model-based testing of ADC nonlinearities. IEEE Trans. Circuits Syst. I Regul. Pap. 51-I(1): 213-217 (2004)

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