Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Wide-Voltage-Range Half-Path Timing Error-Detection System With a ..."

Weiwei Shan et al. (2019)

> Home

Details and statistics

DOI: 10.1109/TCSI.2019.2893294

access: closed

type: Journal Article

metadata version: 2021-02-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/ShanSWCZY19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/ShanSWCZY19
Weiwei Shan, Xinchao Shang, Xing Wan, Hao Cai, Chuan Zhang, Jun Yang:
A Wide-Voltage-Range Half-Path Timing Error-Detection System With a 9-Transistor Transition-Detector in 40-nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(6): 2288-2297 (2019)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.