"GC-eDRAM With Body-Bias Compensated Readout and Error Detection in 28-nm ..."

Robert Giterman et al. (2019)

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DOI: 10.1109/TCSII.2019.2896164

access: closed

type: Journal Article

metadata version: 2020-05-27

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Robert Giterman, Andrea Bonetti, Andreas Burg, Adam Teman:
GC-eDRAM With Body-Bias Compensated Readout and Error Detection in 28-nm FD-SOI. IEEE Trans. Circuits Syst. II Express Briefs 66-II(12): 2042-2046 (2019)

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