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"Persistent and Nonpersistent Error Optimization for STT-RAM Cell Design."

Yaojun Zhang et al. (2017)

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DOI: 10.1109/TCAD.2016.2619484

access: closed

type: Journal Article

metadata version: 2022-07-04

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  - https://dblp.org/rec/journals/tcad/ZhangYWC17
Yaojun Zhang, Bonan Yan, Xiaobin Wang, Yiran Chen:
Persistent and Nonpersistent Error Optimization for STT-RAM Cell Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(7): 1181-1192 (2017)

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