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"Efficient Test Compression Configuration Selection."

Chong-Siao Ye et al. (2022)

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DOI: 10.1109/TCAD.2021.3099100

access: closed

type: Journal Article

metadata version: 2022-06-28

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  - https://dblp.org/rec/journals/tcad/YeZT0LCRZKR22
Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski:
Efficient Test Compression Configuration Selection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2323-2336 (2022)

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