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"Defect Clustering-Aware Spare-TSV Allocation in 3-D ICs for Yield Enhancement."

Shengcheng Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori (2019)

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DOI: 10.1109/TCAD.2018.2864291

access: closed

type: Journal Article

metadata version: 2020-09-24

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Shengcheng Wang, Krishnendu Chakrabarty, Mehdi Baradaran Tahoori:
Defect Clustering-Aware Spare-TSV Allocation in 3-D ICs for Yield Enhancement. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1928-1941 (2019)

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