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"LASIC: Layout Analysis for Systematic IC-Defect Identification Using ..."

Wing Chiu Jason Tam, Ronald Shawn Blanton (2015)

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DOI: 10.1109/TCAD.2015.2406854

access: closed

type: Journal Article

metadata version: 2020-09-24

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Wing Chiu Jason Tam, Ronald Shawn Blanton:
LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(8): 1278-1290 (2015)

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