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"Functional test generation for synchronous sequential circuits."

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal (1996)

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DOI: 10.1109/43.503950

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/SrinivasJA96
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  - https://dblp.org/rec/journals/tcad/SrinivasJA96
Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal:
Functional test generation for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(7): 831-843 (1996)

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