"Test enrichment for path delay faults using multiple sets of target faults."

Irith Pomeranz, Sudhakar M. Reddy (2003)

Details and statistics

DOI: 10.1109/TCAD.2002.805726

access: closed

type: Journal Article

metadata version: 2020-09-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics