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"Estimating the Number of Extra Tests During Iterative Test Generation for ..."

Irith Pomeranz (2023)

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DOI: 10.1109/TCAD.2022.3226677

access: closed

type: Journal Article

metadata version: 2023-08-05

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Irith Pomeranz:
Estimating the Number of Extra Tests During Iterative Test Generation for Single-Cycle Gate-Exhaustive Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(8): 2752-2760 (2023)

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