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"Pass/Fail Data for Logic Diagnosis Under Bounded Transparent Scan."

Irith Pomeranz (2022)

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DOI: 10.1109/TCAD.2021.3134901

access: closed

type: Journal Article

metadata version: 2022-11-13

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Irith Pomeranz:
Pass/Fail Data for Logic Diagnosis Under Bounded Transparent Scan. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4862-4872 (2022)

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