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"Storage-Based Logic Built-in Self-Test With Multicycle Tests."

Irith Pomeranz (2022)

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DOI: 10.1109/TCAD.2021.3128446

access: closed

type: Journal Article

metadata version: 2022-10-18

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Irith Pomeranz:
Storage-Based Logic Built-in Self-Test With Multicycle Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(10): 3553-3557 (2022)

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