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"Close-to-Functional Broadside Tests With a Safety Margin."

Irith Pomeranz (2017)

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DOI: 10.1109/TCAD.2017.2669862

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Close-to-Functional Broadside Tests With a Safety Margin. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2139-2143 (2017)

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