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"Power supply transient signal analysis for defect-oriented test."

James F. Plusquellic et al. (2003)

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DOI: 10.1109/TCAD.2002.807896

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/PlusquellicSPG03
James F. Plusquellic, Abhishek Singh, Chintan Patel, Anne E. Gattiker:
Power supply transient signal analysis for defect-oriented test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(3): 370-374 (2003)

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