"High Volume Diagnosis in Memory BIST Based on Compressed Failure Data."

Nilanjan Mukherjee et al. (2010)

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DOI: 10.1109/TCAD.2010.2041852

access: closed

type: Journal Article

metadata version: 2025-05-01

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Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Jerzy Tyszer:
High Volume Diagnosis in Memory BIST Based on Compressed Failure Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(3): 441-453 (2010)

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