Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: ..."

Qiao Li et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TCAD.2022.3197487

access: closed

type: Journal Article

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/LiYCRKX22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/LiYCRKX22
Qiao Li, Min Ye, Yufei Cui, Tianyu Ren, Tei-Wei Kuo, Chun Jason Xue:
Resolving the Reliability Issues of Open Blocks for 3-D NAND Flash: Observations and Strategies. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4076-4087 (2022)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.