"A Design-for-Test Solution Based on Dedicated Test Layers and Test ..."

Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty (2019)

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DOI: 10.1109/TCAD.2018.2864290

access: closed

type: Journal Article

metadata version: 2020-09-24

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Abhishek Koneru, Sukeshwar Kannan, Krishnendu Chakrabarty:
A Design-for-Test Solution Based on Dedicated Test Layers and Test Scheduling for Monolithic 3-D Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1942-1955 (2019)

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