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"Highly Efficient Test Architecture for Low-Power AI Accelerators."

Muhammad Ibtesam et al. (2022)

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DOI: 10.1109/TCAD.2021.3110739

access: closed

type: Journal Article

metadata version: 2022-08-08

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  - https://dblp.org/rec/journals/tcad/IbtesamSKAP22
Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park:
Highly Efficient Test Architecture for Low-Power AI Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(8): 2728-2738 (2022)

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