Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"TSV Extracted Equivalent Circuit Model and an On-Chip Test Solution."

Zheng Gong, Rashid Rashidzadeh (2016)

> Home

Details and statistics

DOI: 10.1109/TCAD.2015.2474411

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/GongR16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/GongR16
Zheng Gong, Rashid Rashidzadeh:
TSV Extracted Equivalent Circuit Model and an On-Chip Test Solution. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(4): 679-690 (2016)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.