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"Sequential test generation and synthesis for testability at the ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Abhijit Ghosh, Srinivas Devadas, A. Richard Newton (1993)

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DOI: 10.1109/43.277606

access: closed

type: Journal Article

metadata version: 2020-09-24

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  dblp key:
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  - https://dblp.org/rec/journals/tcad/GhoshDN93
Abhijit Ghosh, Srinivas Devadas, A. Richard Newton:
Sequential test generation and synthesis for testability at the register-transfer and logic levels. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(5): 579-598 (1993)

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