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"A beta model for estimating the testability and coverage distributions of ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Hassan A. Farhat, Steven G. From (1993)

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DOI: 10.1109/43.229738

access: closed

type: Journal Article

metadata version: 2020-09-24

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Hassan A. Farhat, Steven G. From:
A beta model for estimating the testability and coverage distributions of a VLSI circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(4): 550-554 (1993)

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