"Improved Perturbation Vector Generation Method for Accurate SRAM Yield ..."

Woong Choi, Jongsun Park (2017)

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DOI: 10.1109/TCAD.2016.2629446

access: closed

type: Journal Article

metadata version: 2020-09-24

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Woong Choi, Jongsun Park:
Improved Perturbation Vector Generation Method for Accurate SRAM Yield Estimation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(9): 1511-1521 (2017)

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