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"Transition fault testing for sequential circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Kwang-Ting Cheng (1993)

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DOI: 10.1109/43.251160

access: closed

type: Journal Article

metadata version: 2022-12-07

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Kwang-Ting Cheng:
Transition fault testing for sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(12): 1971-1983 (1993)

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